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SI3225-X-FQ датащи(PDF) 4 Page - Silicon Laboratories |
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SI3225-X-FQ датащи(HTML) 4 Page - Silicon Laboratories |
4 / 112 page Si3220/25 4 Rev. 1.2 1. Electrical Specifications Table 1. Absolute Maximum Ratings and Thermal Information1 Parameter Symbol Test Condition Value Unit Supply Voltage, Si3200 and Si3220/Si3225 VDD, VDD1–VDD4 –0.5 to 6.0 V High Battery Supply Voltage, Si32002 VBATH Continuous 0.4 to –104 V 10 ms 0.4 to –109 Low Battery Supply Voltage, Si3200 VBAT,VBATL Continuous VBATH V TIP or RING Voltage, Si3205 VTIP,VRING Continuous Pulse < 10 µs Pulse < 4 µs –104 VBATH –15 VBATH –35 TIP, RING Current, Si3200 ITIP, IRING ±100 mA STIPAC, STIPDC, SRINGAC, SRINGDC Current, Si3220/Si3225 ±20 mA Input Current, Digital Input Pins IIN Continuous ±10 mA Si3220/25 Analog Ground Differential Voltage (GND1 to ePad, GND2 to ePad, or GND1 to GND2)3 ∆VGNDA ±50 mV Si3220/25 Digital Ground Differential Voltage (GND3 to GND4)3 ∆VGNDD ±50 mV Si3220/25 Analog to Digital Ground Differential Volt- age (GND1/GND2/ePad to GND3/GND4)3 ∆VGND,A–D ±200 mV Digital Input Voltage VIND –0.3 to (VDDD + 0.3) V Operating Temperature Range TA –40 to 100 °C Storage Temperature Range TSTG –40 to 150 °C Si3220/Si3225 Thermal Resistance, Typical3 (TQFP-64 ePad) θJA 25 °C/W Si3200 Thermal Resistance, Typical4 (SOIC-16 ePad) θJA 55 °C/W Continuous Power Dissipation, Si32005 PD TA =85°C, SOIC-16 1W Continuous Power Dissipation, Si3220/25 PD TA =85°C, TQFP-64 1.6 W Notes: 1. Permanent device damage may occur if the absolute maximum ratings are exceeded. Functional operation should be restricted to the conditions as specified in the operational sections of this data sheet. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. 2. The dv/dt of the voltage applied to the VBAT, VBATH, and VBATL pins must be limited to 10 V/µs. 3. The PCB pad placed under the device package must be connected with multiple vias to the PCB ground layer and to the GND1-GND4 pins via short traces. The TQFP-64 e-Pad must be properly soldered to the PCB pad during PCB assembly. This type of low-impedance grounding arrangement is necessary to ensure that maximum differentials are not exceeded under any operating condition in addition to providing thermal dissipation. 4. The thermal resistance of an exposed pad package is assured when the recommended printed circuit board layout guidelines are followed correctly. The specified performance requires that the exposed pad be soldered to an exposed copper surface of equal size and that multiple vias are added to enable heat transfer between the top-side copper surface and a large internal copper ground plane. Refer to “AN55: Dual ProSLIC® User Guide” or to the Si3220/3225 evaluation board data sheet for specific layout examples. 5. On-chip thermal limiting circuitry will shut down the circuit at a junction temperature of approximately 150 °C. For optimal reliability, junction temperatures above 140 °C should be avoided. |
Аналогичный номер детали - SI3225-X-FQ |
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Аналогичное описание - SI3225-X-FQ |
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