поискавой системы для электроныых деталей |
|
74F455 датащи(PDF) 7 Page - NXP Semiconductors |
|
74F455 датащи(HTML) 7 Page - NXP Semiconductors |
7 / 12 page Philips Semiconductors Product specification 74F455,* 74F456 Buffers/Drivers 1999 Jan 08 7 * Discontinued part. Please see the Discontinued Products List. DC ELECTRICAL CHARACTERISTICS (Over recommended operating free-air temperature range unless otherwise noted.) SYMBOL PARAMETER TEST CONDITIONS1 LIMITS UNIT SYMBOL PARAMETER TEST CONDITIONS1 MIN TYP2 MAX UNIT VCC = MIN IO = 3mA ±10%VCC 2.4 V VOH High-level output voltage VCC = MIN, VIL = MAX, V MIN IOH=–3mA ±5%VCC 2.7 3.3 V VIH = MIN IOH =–15mA ±10%VCC 2.0 V VO Low level output voltage VCC = MIN, VIL = MAX IO = MAX ±10%VCC 0.55 V VOL Low-level output voltage VIL = MAX, VIH = MIN IOL = MAX ±5%VCC 0.42 0.55 V VIK Input clamp voltage VCC = MIN, II = IIK –0.73 –1.2 V II Input current at maximum input voltage VCC = 0.0V, VI = 7.0V 100 µA I High level input current Dn VCC = MAX V =2 7V 40 µA IIH High-level input current Pl, OEn VCC = MAX, VI = 2.7V 20 µA I Low level input current Dn VCC = MAX V =0 5V –40 µA IIL Low-level input current Pl, OEn VCC = MAX, VI = 0.5V –20 µA IOZH Off-state output current High-level voltage applied VCC = MAX, VO = 2.7V 50 µA IOZL Off-state output current Low-level voltage applied VCC = MAX, VO = 0.5V –50 µA IOS Short-circuit output current3 VCC = MAX –100 –225 mA ICCH 50 80 mA ICC Supply current (total) ICCL VCC = MAX 78 110 mA ICCZ 63 90 mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. AC ELECTRICAL CHARACTERISTICS LIMITS SYMBOL PARAMETER TEST CONDITION VCC = +5V Tamb = +25°C CL = 50pF, RL = 500Ω VCC = +5V ± 10% Tamb = 0°C to +70°C CL = 50pF, RL = 500Ω UNIT MIN TYP MAX MIN MAX tPLH tPHL Propagation delay Dn to Qn 74F455 Waveform 2 2.0 1.0 4.5 2.0 6.5 4.0 2.0 1.0 7.5 4.5 ns tPLH tPHL Propagation delay Dn to Qn 74F456 Waveform 1 2.0 2.5 4.5 5.0 6.5 7.0 2.0 2.5 7.0 7.5 ns tPLH tPHL Propagation delay Dn to SE, SO Waveform 1, 2 5.5 5.5 10.0 11.0 13.0 14.5 5.5 5.5 14.0 16.5 ns tPZH tPZL Output Enable time to High or Low level Waveform 3 Waveform 4 2.5 4.0 4.0 8.0 8.0 10.5 2.5 4.0 9.0 11.5 ns tPHZ tPLZ Output Disable time from High or Low level Waveform 3 Waveform 4 1.5 2.0 4.0 5.0 6.5 7.5 1.5 2.0 7.5 8.0 ns |
Аналогичный номер детали - 74F455 |
|
Аналогичное описание - 74F455 |
|
|
ссылки URL |
Конфиденциальность |
ALLDATASHEETRU.COM |
Вашему бизинису помогли Аллдатащит? [ DONATE ] |
Что такое Аллдатащит | реклама | контакт | Конфиденциальность | обмен ссыками | поиск по производителю All Rights Reserved©Alldatasheet.com |
Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
Family Site : ic2ic.com |
icmetro.com |