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ABSOLUTE MAXIMUM RATINGS

TPA721

SLOS231E – NOVEMBER 1998 – REVISED JUNE 2004

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated

circuits be handled with appropriate precautions. Failure to observe proper handling and installation

procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision

integrated circuits may be more susceptible to damage because very small parametric changes could

cause the device not to meet its published specifications.

AVAILABLE OPTIONS

PACKAGED DEVICES

MSOP

SYMBOLIZATION

(D)

(DGN)

–40

°C to 85°C

TPA721D

TPA721DGN

ABC

(1)

In the D package, the maximum output power is thermally limited to 350 mW; 700 mW peaks can be

driven, as long as the RMS value is less than 350 mW.

(2)

The D and DGN packages are available taped and reeled. To order a taped and reeled part, add the

suffix R to the part number (e.g., TPA301DR).

Terminal Functions

TERMINAL

I/O

DESCRIPTION

NAME

NO.

BYPASS is the tap to the voltage divider for internal mid-supply bias. This terminal should be connected to a

BYPASS

2

I

0.1-µF to 2.2-µF capacitor when used as an audio amplifier.

GND

7

GND is the ground connection.

IN-

4

I

IN- is the inverting input. IN- is typically used as the audio input terminal.

IN+

3

I

IN+ is the noninverting input. IN+ is typically tied to the BYPASS terminal.

SHUTDOWN

1

I

SHUTDOWN places the entire device in shutdown mode when held high.

6

5

O

8

O

UNIT

Supply voltage

6 V

Input voltage

Continuous total power dissipation

Internally limited (see Dissipation Rating Table)

Operating free-air temperature range

–40

°C to 85°C

Operating junction temperature range

–40

°C to 150°C

Storage temperature range

–65

°C to 150°C

Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds

260

°C

(1)

Stresses beyond those listed under "absolute maximum ratings” may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating

conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

2