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SN74LS00D датащит (Datasheet) 1 Page - Texas Instruments

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№ деталь SN74LS00D
подробность  QUADRUPLE 2-INPUT POSITIVE-NAND GATES
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производитель  TI [Texas Instruments]
домашняя страница  http://www.ti.com
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SN5400, SN54LS00, SN54S00
SN7400, SN74LS00, SN74S00
QUADRUPLE 2INPUT POSITIVENAND GATES
SDLS025B − DECEMBER 1983 − REVISED OCTOBER 2003
1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
D Package Options Include Plastic
Small-Outline (D, NS, PS), Shrink
Small-Outline (DB), and Ceramic Flat (W)
Packages, Ceramic Chip Carriers (FK), and
Standard Plastic (N) and Ceramic (J) DIPs
D Also Available as Dual 2-Input
Positive-NAND Gate in Small-Outline (PS)
Package
SN5400 ...J PACKAGE
SN54LS00, SN54S00 ...J OR W PACKAGE
SN7400, SN74S00 . . . D, N, OR NS PACKAGE
SN74LS00 . . . D, DB, N, OR NS PACKAGE
(TOP VIEW)
1
2
3
4
5
6
7
14
13
12
11
10
9
8
1A
1B
1Y
2A
2B
2Y
GND
VCC
4B
4A
4Y
3B
3A
3Y
SN5400 ...W PACKAGE
(TOP VIEW)
1
2
3
4
5
6
7
14
13
12
11
10
9
8
1A
1B
1Y
VCC
2Y
2A
2B
4Y
4B
4A
GND
3B
3A
3Y
SN74LS00, SN74S00 ...PS PACKAGE
(TOP VIEW)
1
2
3
4
8
7
6
5
VCC
2B
2A
2Y
1A
1B
1Y
GND
32 1 20 19
910 11 12 13
4
5
6
7
8
18
17
16
15
14
4A
NC
4Y
NC
3B
1Y
NC
2A
NC
2B
SN54LS00, SN54S00 . . . FK PACKAGE
(TOP VIEW)
NC − No internal connection
description/ordering information
These devices contain four independent 2-input NAND gates. The devices perform the Boolean function
Y = A
• B or Y = A + B in positive logic.
Copyright
 2003, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
On products compliant to MILPRF38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.




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