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ST25EM6TR датащи(PDF) 2 Page - STMicroelectronics

номер детали ST25EM6TR
подробное описание детали  16 Kbit Serial I2C EEPROM with Extended Addressing
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производитель  STMICROELECTRONICS [STMicroelectronics]
домашняя страница  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

ST25EM6TR датащи(HTML) 2 Page - STMicroelectronics

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SDA
VSS
SCL
WC
E1
E0
VCC
E2
AI01103B
ST24E16
ST25E16
1
2
3
4
8
7
6
5
Figure 2A. DIP Pin Connections
1
AI01104C
2
3
4
8
7
6
5
SDA
VSS
SCL
WC
E1
E0
VCC
E2
ST24E16
ST25E16
Figure 2B. SO Pin Connections
Both Plastic Dual-in-Line and Plastic Small Outline
packages are available.
Each memory is compatible with the I2C extended
addressing standard, two wire serial interface
which uses a bi-directional data bus and serial
clock. The ST24/25E16 carry a built-in 4 bit, unique
device identification code (1010) corresponding to
DESCRIPTION (cont’d)
the I2C bus definition. The ST24/25E16 behave as
slave devices in the I2C protocol with all memory
operations synchronized by the serial clock. Read
and write operations are initiated by a START
condition generated by the bus master. The START
condition is followed by a stream of 4 bits (identifi-
cation code 1010), 3 bit Chip Enable input to form
a 7 bit Device Select, plus one read/write bit and
terminated by an acknowledge bit.
Symbol
Parameter
Value
Unit
TA
Ambient Operating Temperature
–40 to 125
°C
TSTG
Storage Temperature
–65 to 150
°C
TLEAD
Lead Temperature, Soldering
(SO8)
(PSDIP8)
40 sec
10 sec
215
260
°C
VIO
Input or Output Voltages
–0.6 to 6.5
V
VCC
Supply Voltage
–0.3 to 6.5
V
VESD
Electrostatic Discharge Voltage (Human Body model)
(2)
4000
V
Electrostatic Discharge Voltage (Machine model)
(3)
500
V
Notes: 1. Except for the rating "Operating Temperature Range", stresses above those listed in the Table "Absolute Maximum Ratings"
may cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other
conditions above those indicated in the Operating sections of this specification is not implied. Exposure to Absolute Maximum
Rating conditions for extended periods may affect device reliability. Refer also to the STMicroelectronics SURE Program and
other relevant quality documents.
2. 100pF through 1500
Ω; MIL-STD-883C, 3015.7
3. 200pF through 0
Ω; EIAJ IC-121 (condition C)
Table 2. Absolute Maximum Ratings (1)
2/16
ST24E16, ST25E16


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