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74LVC1GX04DBVTG4 датащи(PDF) 2 Page - Texas Instruments

номер детали 74LVC1GX04DBVTG4
подробное описание детали  CRYSTAL OSCILLATOR DRIVER
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производитель  TI1 [Texas Instruments]
домашняя страница  http://www.ti.com
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74LVC1GX04DBVTG4 датащи(HTML) 2 Page - Texas Instruments

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DESCRIPTION/ORDERING INFORMATION (CONTINUED)
X1
X2
3
4
Y
6
Absolute Maximum Ratings
(1)
SN74LVC1GX04
CRYSTAL OSCILLATOR DRIVER
SCES581B – JULY 2004 – REVISED DECEMBER 2006
X1 and X2 can be connected to a crystal or resonator in oscillator applications. The device provides an
additional buffered inverter (Y) for signal conditioning (see Figure 3). The additional buffered inverter improves
the signal quality of the crystal oscillator output by making it rail to rail.
NanoStar™ and NanoFree™ package technology is a major breakthrough in IC packaging concepts, using the
die as the package.
This device is fully specified for partial-power-down applications using Ioff (Y output only). The Ioff circuitry
disables the outputs, preventing damaging current backflow through the device when it is powered down.
FUNCTION TABLE
OUTPUTS
INPUT
X1
X2
Y
H
L
H
L
H
L
LOGIC DIAGRAM (POSITIVE LOGIC)
over operating free-air temperature range (unless otherwise noted)
MIN
MAX
UNIT
VCC
Supply voltage range
–0.5
6.5
V
VI
Input voltage range(2)
–0.5
6.5
V
VO
Voltage range applied to Y output in the high-impedance or power-off state(2)
–0.5
6.5
V
VO
Voltage range applied to any output in the high or low state(2)(3)
–0.5
VCC + 0.5
V
IIK
Input clamp current
VI < 0
–50
mA
IOK
Output clamp current
VO < 0
–50
mA
IO
Continuous output current
±50
mA
Continuous current through VCC or GND
±100
mA
DBV package
165
DCK package
259
θ
JA
Package thermal impedance(4)
°C/W
DRL package
142
YEP/YZP package
123
Tstg
Storage temperature range
–65
150
°C
(1)
Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2)
The input and output negative-voltage ratings may be exceeded if the input and output current ratings are observed.
(3)
The value of VCC is provided in the recommended operating conditions table.
(4)
The package thermal impedance is calculated in accordance with JESD 51-7.
2
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