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DAC813 датащи(PDF) 3 Page - Texas Instruments

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номер детали DAC813
подробное описание детали  Microprocessor-Compatible 12-BIT DIGITAL-TO-ANALOG CONVERTER
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производитель  TI1 [Texas Instruments]
домашняя страница  http://www.ti.com
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DAC813 датащи(HTML) 3 Page - Texas Instruments

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DAC813
The information provided herein is believed to be reliable; however, BURR-BROWN assumes no responsibility for inaccuracies or omissions. BURR-BROWN assumes
no responsibility for the use of this information, and all use of such information shall be entirely at the user’s own risk. Prices and specifications are subject to change
without notice. No patent rights or licenses to any of the circuits described herein are implied or granted to any third party. BURR-BROWN does not authorize or warrant
any BURR-BROWN product for use in life support devices and/or systems.
+VCC to ACOM .......................................................................... 0 to +18V
–VCC to ACOM .......................................................................... 0 to –18V
+VCC to –VCC ............................................................................ 0 to +36V
DCOM with respect to ACOM .............................................................
±4V
Digital Inputs (Pins 11–15, 17–28) to DCOM .................... –0.5V to +VCC
External Voltage Applied to BPO Span Resistor ..............................
±V
CC
VREF OUT ........................................................... Indefinite Short to ACOM
VOUT ................................................................. Indefinite Short to ACOM
Power Dissipation .......................................................................... 750mW
Lead Temperature (soldering, 10s) ............................................... +300
°C
Max Junction Temperature ............................................................ +165
°C
Thermal Resistance,
θ
J-A: Plastic DIP and SOIC ........................ 130°C/W
Ceramic DIP ......................................... 85
°C/W
NOTE: (1) Stresses above those listed under “Absolute Maximum Ratings”
may cause permanent damage to the device. Exposure to absolute maximum
conditions for extended periods may affect device reliability.
ABSOLUTE MAXIMUM RATINGS(1)
PIN
NAME
DESCRIPTION
1+VL
Positive supply pin for logic circuits. Connect to +VCC.
2, 3
20V Range
Connect Pin 2 or Pin 3 to Pin 9 (VOUT) for a 20V
FSR. Connect both to Pin 9 for a 10V FSR.
4
BPO
Bipolar offset. Connect to Pin 6 (VREF OUT) through
100
Ω resistor or 200Ω potentiometer for bipolar
operation.
5
ACOM
Analog common,
±V
CC supply return.
6VREF OUT
+10V reference output referred to ACOM.
7VREF IN
Connected to VREF OUT through a 1kΩ gain
adjustment potentiometer or a 500
Ω resistor.
8+VCC
Analog supply input, nominally +12V to +15V
referred to ACOM.
9VOUT
D/A converter voltage output.
10
–VCC
Analog supply input, nominally –12V or –15V
referred to ACOM.
11
WR
Master enable for LDAC, LLSB, and LMSB. Must
be low for data transfer to any latch.
12
LDAC
Load DAC. Must be low with WR for data transfer
to the D/A latch and simultaneous update of the
D/A converter.
13
Reset
When low, resets the D/A latch such that a Bipolar
Zero output is produced. This control overrides all
other data input operations.
14
LMSB
Enable for 4-bit input latch of D8-D11 data inputs.
NOTE: This logic path is slower than the WR path.
15
LLSB
Enable for 8-bit input latch of D0-D7 data inputs.
NOTE: This logic path is slower than the WR path.
16
DCOM
Digital common.
17
D0
Data Bit 1, LSB.
18
D1
Data Bit 2.
19
D2
Data Bit 3.
20
D3
Data Bit 4.
21
D4
Data Bit 5.
22
D5
Data Bit 6.
23
D6
Data Bit 7.
24
D7
Data Bit 8.
25
D8
Data Bit 9.
26
D9
Data Bit 10.
27
D10
Data Bit 11.
28
D11
Data Bit 12, MSB, positive true.
PIN DESCRIPTIONS
ELECTROSTATIC
DISCHARGE SENSITIVITY
Electrostatic discharge can cause damage ranging from per-
formance degradation to complete device failure. Burr-
Brown Corporation recommends that all integrated circuits
be handled and stored using appropriate ESD protection
methods.
ESD damage can range from subtle performance degrada-
tion to complete device failure. Precision integrated circuits
may be more susceptible to damage because very small
parametric changes could cause the device not to meet
published specifications.
PACKAGE/ORDERING INFORMATION
PACKAGE
LINEARITY
GAIN
DRAWING
TEMPERATURE
ERROR, MAX
DRIFT
PRODUCT
PACKAGE
NUMBER(1)
RANGE
AT +25
°C (LSB)
(ppm/
°C)
DAC813JP
28-Pin Plastic DIP
246
0
°C to +70°C
±1/2
±30
DAC813JU
28-Lead Plastic SOIC
217
0
°C to +70°C
±1/2
±30
DAC813KP
28-Pin Plastic DIP
246
0
°C to +70°C
±1/4
±15
DAC813KU
28-Lead Plastic SOIC
217
0
°C to +70°C
±1/4
±15
DAC813AU
28-Lead Plastic SOIC
217
–40
°C to +85°C
±1/2
±30
NOTE: (1) For detailed drawing and dimension table, please see end of data sheet, or Appendix C of Burr-Brown IC Data Book.


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