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SN74ACT8999 датащи(PDF) 1 Page - Texas Instruments |
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SN74ACT8999 датащи(HTML) 1 Page - Texas Instruments |
1 / 29 page SN54ACT8999, SN74ACT8999 SCANPATH SELECTORS WITH 8BIT BIDIRECTIONAL DATA BUSES SCANCONTROLLED IEEE STD 1149.1 (JTAG) TAP MULTIPLEXERS SCAS158D − JUNE 1990 − REVISED DECEMBER 1996 1 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251−1443 D Members of theTexas Instruments SCOPE Family of Testability Products D Compatible With the IEEE Standard 1149.1 (JTAG) Serial Test Bus D Allow Partitioning of System Scan Paths D Can Be Cascaded Horizontally or Vertically D Select One of Four Secondary Scan Paths to Be Included in a Primary Scan Path D Provide Communication Between Primary and Remote Test Bus Controllers D Include 8-Bit Programmable Binary Counter to Count or Initiate Interrupt Signals D Include 8-Bit Identification Bus for Scan Path Identification D Inputs Are TTL Compatible D EPIC (Enhanced-Performance Implanted CMOS) 1- µm Process D Package Options Include Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK), and Standard Plastic (NT) and Ceramic (JT) 300-mil DIPs description The ’ACT8999 are members of the Texas Instruments SCOPE testability integrated- circuit family. This family of components facilitates testing of complex circuit-board assemblies. The ’ACT8999 enhance the scan capability of TI’s SCOPE family by allowing augmentation of a system’s primary scan path with secondary scan paths (SSPs), which can be individually selected by the ’ACT8999 for inclusion in the primary scan path. The device also provides buffering of test signals to reduce the need for external logic. By loading the proper values into the instruction register and data registers, the user can select one of four secondary scan paths. This has the effect of shortening the scan path to allow maximum test throughput when an individual subsystem (board or box) is to be tested. Any of the device’s six data registers or the instruction register can be placed in the device’s scan path, i.e., placed between test data input (TDI) and test data output (TDO) for subsequent shift and scan operations. All operations of the device except counting are synchronous to the test clock (TCK). The 8-bit programmable up/down counter can be used to count transitions on the device condition input (DCI) and output interrupt signals via the device condition output (DCO). The device can be configured to count on either the rising or falling edge of DCI. 1 2 3 4 5 6 7 8 9 10 11 12 13 14 28 27 26 25 24 23 22 21 20 19 18 17 16 15 DTDI OTMS DCO MCO DTDO DTCK GND DTMS1 DTMS2 DTMS3 DTMS4 DTRST TDO TMS DCI MCI ID1 ID2 ID3 ID4 ID5 VCC ID6 ID7 ID8 TRST TDI TCK SN54ACT8999 ...JT PACKAGE SN74ACT8999 . . . DW OR NT PACKAGE (TOP VIEW) 32 1 13 14 5 6 7 8 9 10 11 ID8 TRST TDI TCK TMS TDO DTRST ID1 MCI DCI DTDI OTMS DCO MCO 4 15 16 17 18 28 27 26 25 24 23 22 21 20 19 12 SN54ACT8999 . . . FK PACKAGE (TOP VIEW) Copyright 1996, Texas Instruments Incorporated PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. SCOPE and EPIC are trademarks of Texas Instruments Incorporated. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. On products compliant to MILPRF38535, all parameters are tested unless otherwise noted. On all other products, production processing does not necessarily include testing of all parameters. |
Аналогичный номер детали - SN74ACT8999 |
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Аналогичное описание - SN74ACT8999 |
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