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AD7545SQ датащи(PDF) 3 Page - Analog Devices |
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AD7545SQ датащи(HTML) 3 Page - Analog Devices |
3 / 8 page AD7545 –3– REV. A ABSOLUTE MAXIMUM RATINGS* (TA = + 25 °C unless otherwise noted) VDD to DGND . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3, +17 V Digital Input Voltage to DGND . . . . . . . –0.3 V, VDD +0.3 V VRFB, VREF to DGND . . . . . . . . . . . . . . . . . . . . . . . . . ±25 V VPIN1 to DGND . . . . . . . . . . . . . . . . . . . . –0.3 V, VDD +0.3 V AGND to DGND . . . . . . . . . . . . . . . . . –0.3 V, VDD + 0.3 V Power Dissipation (Any Package) to +75 °C . . . . . . . 450 mW Derates above +75 °C . . . . . . . . . . . . . . . . . . . . . . 6 mW/°C Operating Temperature TERMINOLOGY RELATIVE ACCURACY The amount by which the D/A converter transfer function differs from the ideal transfer function after the zero and full- scale points have been adjusted. This is an endpoint linearity measurement. DIFFERENTIAL NONLINEARITY The difference between the measured change and the ideal change between any two adjacent codes. If a device has a differ- ential nonlinearity of less than 1 LSB it will be monotonic, i.e., the output will always increase for an increase in digital code applied to the D/A converter. PROPAGATION DELAY This is a measure of the internal delay of the circuit and is mea- sured from the time a digital input changes to the point at which the analog output at OUT1 reaches 90% of its final value. DIGITAL-TO-ANALOG GLITCH IMPULSE This is a measure of the amount of charge injected from the digital inputs to the analog outputs when the inputs change state. It is usually specified as the area of the glitch in nV secs and is measured with VREF = AGND and an ADLH0032CG as the output op amp, C1 (phase compensation) = 33 pF. Commercial (J, K, L, GL) Grades . . . . . . . . 0 °C to +70°C Industrial (A, B, C, GC) Grades . . . . . . . . –25 °C to +85°C Extended (S, T, U, GU) Grades . . . . . . . –55 °C to +125°C Storage Temperature . . . . . . . . . . . . . . . . . . –65 °C to +150°C Lead Temperature (Soldering, 10 secs) . . . . . . . . . . . +300 °C *Stresses above those listed under Absolute Maximum Ratings may cause perma- nent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. WARNING! ESD SENSITIVE DEVICE CAUTION ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the AD7545 features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality. ORDERING GUIDE 1 Maximum Gain Error Temperature Relative TA = +25 C Package Model2 Range Accuracy VDD = +5 V Options3 AD7545JN 0 °C to +70°C ± 2 LSB ±20 LSB N-20 AD7545AQ –25 °C to +85°C ± 2 LSB ±20 LSB Q-20 AD7545SQ –55 °C to +125°C ± 2 LSB ±20 LSB Q-20 AD7545KN 0 °C to +70°C ± 1 LSB ±10 LSB N-20 AD7545BQ –25 °C to +85°C ± 1 LSB ±10 LSB Q-20 AD7545TQ –55 °C to +125°C ± 1 LSB ±10 LSB Q-20 AD7545LN 0 °C to +70°C ± 1/2 LSB ±5 LSB N-20 AD7545CQ –25 °C to +85°C ± 1/2 LSB ±5 LSB Q-20 AD7545UQ –55 °C to +125°C ± 1/2 LSB ±5 LSB Q-20 AD7545GLN 0 °C to +70°C ± 1/2 LSB ±1 LSB N-20 AD7545GCQ –25 °C to +85°C ± 1/2 LSB ±1 LSB Q-20 AD7545GUQ –55 °C to +125°C ± 1/2 LSB ±1 LSB Q-20 AD7545JP 0 °C to +70°C ± 2 LSB ±20 LSB P-20A AD7545SE –55 °C to +125°C ± 2 LSB ±20 LSB E-20A AD7545KP 0 °C to +70°C ± 1 LSB ±10 LSB P-20A AD7545TE –55 °C to +125°C ± 1 LSB ±10 LSB E-20A AD7545LP 0 °C to +70°C ± 1/2 LSB ±5 LSB P-20A AD7545UE –55 °C to +125°C ± 1/2 LSB ±5 LSB E-20A AD7545GLP 0 °C to +70°C ± 1/2 LSB ±1 LSB P-20A AD7545GUE –55 °C to +125°C ± 1/2 LSB ±1 LSB E-20A NOTES 1Analog Devices reserves the right to ship either ceramic (D-20) in lieu of cerdip packages (Q-20). 2To order MIL-STD-883, Class B process parts, add /883B to part number. Contact local sales office for military data sheet. For U.S. Standard Military DRAWING (SMD) see DESC drawing 5962-87702. 3E = Leadless Ceramic Chip Carrier; N = Plastic DIP; P = Plastic Leaded Chip Carrier; Q = Cerdip. Write Cycle Timing Diagram CHIP SELECT WRITE DATA IN (DB0–DB11) VDD 0 VDD 0 VDD 0 DATA VALID VIH VIL tDS tDH tWR tCS tCH MODE SELECTION CS AND WR LOW, DAC RESPONDS TO DATA BUS (DB0–DB11) INPUTS. WRITE MODE: HOLD MODE: EITHER CS OR WR HIGH, DATA BUS (DB0–DB11) IS LOCKED OUT; DAC HOLDS LAST DATA PRESENT WHEN WR OR CS ASSUMED HIGH STATE. NOTES: VDD = +5V; tr = tf = 20ns VDD = +15V; tr = tf = 40ns ALL INPUT SIGNAL RISE AND FALL TIMES MEASURED FROM 10% TO 90% OF VDD. TIMING MEASUREMENT REFERENCE LEVEL IS VIH + VIL/2. |
Аналогичный номер детали - AD7545SQ |
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Аналогичное описание - AD7545SQ |
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