поискавой системы для электроныых деталей |
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HCPL-5121 датащи(PDF) 7 Page - AVAGO TECHNOLOGIES LIMITED |
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HCPL-5121 датащи(HTML) 7 Page - AVAGO TECHNOLOGIES LIMITED |
7 / 16 page 7 Package Characteristics Over recommended operating conditions (T A = -55 to +125 C) unless otherwise specified. Parameter Symbol Test Conditions Group A Subgroups (13) Limits Units Fig Note Min. Typ.* Max. Input-Output Leakage Current I I-O V I-O = 1500Vdc, RH 65%, t = 5 sec., T A = 25 C 1 1.0 A 5, 6 Resistance (Input-Output) R I-O V I-O = 500 V DC 1010 6 Capacitance (Input-Output) C I-O f = 1 MHz 2.5 pF 6 *All typicals at T A = 25 C. Notes: 1. Maximum pulse width = 10 s, maximum duty cycle = 0.2%. This value is intended to allow for component tolerances for designs with I O peak minimum = 2.0 A. See Applications section for additional details on limiting I OH peak. 2. Maximum pulse width = 50 s, maximum duty cycle = 0.5%. 3. In this test V OH is measured with a dc load current. When driving capacitive loads V OH will approach V CC as I OH approaches zero amps. 4. Maximum pulse width = 1 ms, maximum duty cycle = 20%. 5. This is a momentary withstand test, not an operating condition. 6. Device considered a two-terminal device: pins on input side shorted together and pins on output side shorted together. 7. The difference between t PHL and t PLH between any two HCPL-5120 parts under the same test condition. 8. Pins 1 and 4 need to be connected to LED common. 9. Common mode transient immunity in the high state is the maximum tolerable dV CM /dt of the common mode pulse, V CM , to assure that the output will remain in the high state (i.e., V O > 15.0 V). 10. Common mode transient immunity in a low state is the maximum tolerable dV CM /dt of the common mode pulse, V CM , to assure that the output will remain in a low state (i.e., V O < 1.0 V). 11. This load condition approximates the gate load of a 1200 V/75A IGBT. 12. Pulse Width Distortion (PWD) is defined as |t PHL -t PLH | for any given device. 13. Standard parts receive 100% testing at 25 C (Subgroups 1 and 9). SMD and Class H parts receive 100% testing at 25, 125, and -55C (Sub groups 1 and 9, 2 and 10, 3 and 11, respectively). 14. Parameters are tested as part of device initial characterization and after design and process changes. Parameters are guaranteed to limits specified for all lots not specifically tested. |
Аналогичный номер детали - HCPL-5121 |
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Аналогичное описание - HCPL-5121 |
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