NXP Semiconductors

BAS21AVD

High-voltage switching diodes

BAS21AVD

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Product data sheet

1 August 2013

5 / 11

0

50

100

200

(V)

300

0

100

200

150

mle167

FR4 PCB, standard footprint

Fig. 5. Reverse voltage as a function of ambient

temperature; derating curve

mbg442

0

100

200

300

200

0

100

(mA)

FR4 PCB, standard footprint

Fig. 6. Forward current as a function of ambient

temperature; derating curve

11. Test information

trr

(1)

t

output signal

t

10 %

90 %

input signal

D.U.T.

SAMPLING

OSCILLOSCOPE

mga881

Fig. 7. Reverse recovery time test circuit and waveforms

11.1 Quality information

This product has been qualified in accordance with the Automotive Electronics Council

(AEC) standard Q101 - Stress test qualification for discrete semiconductors, and is

suitable for use in automotive applications.