Discontinued

Parts

CAT24WC01/02/04/08/16

2

Doc. No. 1022, Rev. O

© Catalyst Semiconductor, Inc.

Characteristics subject to change without notice

ABSOLUTE MAXIMUM RATINGS*

Temperature Under Bias ................. –55

°C to +125°C

Storage Temperature ....................... –65

°C to +150°C

Voltage on Any Pin with

Package Power Dissipation

Capability (Ta = 25

°C)................................... 1.0W

Lead Soldering Temperature (10 secs) ............ 300

°C

*COMMENT

Stresses above those listed under “Absolute Maximum

Ratings” may cause permanent damage to the device.

These are stress ratings only, and functional operation of

the device at these or any other conditions outside of those

listed in the operational sections of this specification is not

implied. Exposure to any absolute maximum rating for

extended periods may affect device performance and

reliability.

RELIABILITY CHARACTERISTICS

Symbol

Parameter

Min.

Max.

Units

Endurance

1,000,000

Cycles/Byte

Data Retention

100

Years

ESD Susceptibility

2000

Volts

Latch-up

100

mA

D.C. OPERATING CHARACTERISTICS

Limits

Symbol

Parameter

Min.

Typ.

Max.

Units

Test Conditions

Power Supply Current

3

mA

1

Input Leakage Current

10

Output Leakage Current

10

Input Low Voltage

V

Input High Voltage

V

0.4

V

0.5

V

Note:

(1) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC

(2) Output shorted for no more than one second. No more than one output shorted at a time.

(3) These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC-Q100

and JEDEC test methods.

Symbol

Test

Max.

Units

Conditions

Input/Output Capacitance (SDA)

8

pF

Input Capacitance (A0, A1, A2, SCL, WP)

6

pF