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ISL54214EVAL1Z датащи(PDF) 8 Page - Intersil Corporation |
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ISL54214EVAL1Z датащи(HTML) 8 Page - Intersil Corporation |
8 / 22 page ISL54214 8 FN6816.3 June 28, 2010 Test Circuits and Waveforms Logic input waveform is inverted for switches that have the opposite logic sense. FIGURE 1A. ADDRESS tTRANS MEASUREMENT POINTS Repeat test for all switches. CL includes fixture and stray capacitance. FIGURE 1B. ADDRESS tTRANS TEST CIRCUIT FIGURE 1. SWITCHING TIMES FIGURE 2A. MEASUREMENT POINTS Repeat test for all switches. CL includes fixture and stray capacitance. FIGURE 2B. TEST CIRCUIT FIGURE 2. BREAK-BEFORE-MAKE TIME FIGURE 3. AUDIO rON TEST CIRCUIT FIGURE 4. USB rON TEST CIRCUIT 50% tr < 20ns tf < 20ns tOFF 90% VC0,C1 0V VINPUT VC0,C1 tON LOGIC INPUT SWITCH INPUT SWITCH OUTPUT 90% VOUT VOUT V(INPUT) RL RL rON + ------------------------ = SWITCH INPUT LOGIC VOUT RL CL COMx C0, C1 50 Ω 10pF GND VDD C VINPUT INPUT 90% VC0 VC1 tD LOGIC INPUT SWITCH OUTPUT 0V VOUT LOGIC C0, C1 COMx RL CL VOUT 10pF 50 Ω 1D- OR 1D+ L OR R VDD GND VINPUT C INPUT 2D- OR 2D+ VDD C COMx L OR R GND VL OR VR V1 rON = V1/60mA 40mA Repeat test for all switches. VC0H C0 C1 VC1H VDD C 0V D- OR D+ COMx C0 GND VD- OR VD+ V1 rON = V1/40mA 40mA Repeat test for all switches. C1 VDD ISL54214 |
Аналогичный номер детали - ISL54214EVAL1Z |
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Аналогичное описание - ISL54214EVAL1Z |
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