LM185-1.2QML

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SNVS384B – OCTOBER 2005 – REVISED JANUARY 2014

LM185-1.2RLQV SMD 5962R8759461 Post 100 krad Electrical Characteristics DC Parameters

(1) (2)

Sub-

Symbol

Parameter

Conditions

Notes

Min

Max

Units

groups

Change in Reverse Breakdown

(3)

-3

3

%

1

Voltage

(3)

-3

3

%

1

(3)

-2.5

2.5

%

1

10µA

-15

15

mV

1

Change with Current

1mA

-25

25

mV

1

Forward Bias Voltage

-1.0

-0.4

V

1

(1)

Radiation hardness assured (RHA) products are those with an "RLQV" suffix in the Texas Instruments' part number or those with an "R"

in the SMD number, following "5962".

(2)

Testing and qualification for RHA products is done on a wafer level according to MIL-STD-883, Test Method 1019. Testing is performed

with a 1.5X overtest. To be rated at 100 krad(Si) units are tested to 150 krad(Si) with all parameters remaining inside the post 100 krad

Electrical DC test limits in this table. Interim test points are taken at 50, 75 and 100 krad(Si).

(3)

Change from the 0 rad reading.

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