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FAN41501SX датащи(PDF) 5 Page - Fairchild Semiconductor

номер детали FAN41501SX
подробное описание детали  Ground Fault Interrupter Self-Test Digital Controller
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производитель  FAIRCHILD [Fairchild Semiconductor]
домашняя страница  http://www.fairchildsemi.com
Logo FAIRCHILD - Fairchild Semiconductor

FAN41501SX датащи(HTML) 5 Page - Fairchild Semiconductor

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© 2014 Fairchild Semiconductor Corporation
www.fairchildsemi.com
FAN41501
• 1.0.1
5
Functional Description
(Refer to Figure 1)
Starting
in
June
2015,
UL943
will
require
all
permanently connected GFCI products to perform a self
test function. The FAN41501, together with a GFI
controller device
– like the FAN4149 – provides GFI
fault protection and periodic self testing of the key GFCI
components: solenoid, SCR, GFI controller, sense coil,
and other discrete components.
The FAN41501 has an internal 5.35 V shunt regulator.
With diodes D2-5 and resistor R2, the shunt regulator
clamps the FAN41501 VDD supply voltage to 5.35 V.
Capacitor C5 provides bias during the VAC zero phase
crossing so the FAN41501 is continuously biased.
When power is first applied, an internal Power-On-Reset
(POR) circuit detects when VDD is greater than 2.5 V.
The POR circuit generates an internal reset pulse and
initializes a one-second timer. After one second, the first
self-test cycle starts. During the positive half cycle when
the
“line-hot” voltage is positive with respect to the “line-
neutral
” voltage, the SCR anode voltage is monitored by
means of resistor R4 connected to pin 1 (SCR Test).
The FAN41501 clamps this pin to VDD, mirrors the
current through R4 to an internal low-pass filter circuit,
and compares its value to an internal reference
threshold. When the current level exceeds the reference
threshold, an internal latch is set. This test determines
the continuity of the solenoid and SCR. The threshold
level is determined by:
Vthrms = (65 A x R4) + 4
(1)
where Vthrms is the rms VAC input voltage with a
tolerance of ±10%.
With the recommended application values, the SCR
anode voltage must exceed a worst-case peak voltage
of approximately 65 V (rms). Equation (1) can be used if
a lower threshold voltage value is desired to allow this
test to pass during a brownout or voltage sag condition.
To test the functionality of the GFCI controller, sense
coil, and SCR; a simulated ground fault condition is
generated. Like the SCR Test pin; the Phase pin (pin 4)
is clamped to VDD + 700 mV, mirrors the current through
R3 to an internal low-pass filter circuit, and compares its
value to an internal reference. This internal circuit
detects when the phase signal is near the end of the
positive half cycle. When this occurs, an internal current
source is enabled to bias the SCR Test pin. This
prevents the SCR anode voltage from discharging to
zero during the negative half cycle since it is reverse-
biased by diode D1. At the end of the positive half cycle,
the FAN41501 generates a current pulse for the Fault
Test pin (pin 6). This current pulse enables transistor
Q2, which biases the collector voltage of Q2 to a low
voltage. During the negative half cycle when the line-
neutral voltage is positive with respect to the line-hot
voltage, current flows through resistor RTEST2 when Q2 is
enabled. This current creates a simulated ground fault
from line-neutral to load hot. This current is detected by
the GFI controller (i.e. FAN4149) and, when it exceeds
the programmed trip threshold set by RSET (typically
5 mArms), the controller enables the SCR Q1 (see
FAN4149 datasheet for IFAULT trip threshold equation).
The SCR quickly discharges the anode voltage, which is
pre-biased
by
the
FAN41501
control
logic.
The
discharge of the anode voltage also biases the voltage
at the SCR Test pin to a low voltage by forward-biasing
diode D6. The FAN41501 monitors the SCR Test pin
during this test cycle and sets a latch if the SCR is
triggered. The simulated ground fault tests for the
functionality of the controller, R1, D1, D2-5
(5), sense coil,
and SCR without opening the load contacts. The load
contacts do not open during this test because D1 is
reversed biased, which prevents current from energizing
the solenoid. Once the FAN41501 detects the triggering
of the SCR, the current pulse for Q2 is disabled and the
bias current for pin SCR Test is removed. This disables
the SCR so that during the next positive half cycle the
solenoid is not energized. With the recommended
application values, the simulated ground fault triggers
the controller with a VAC input voltage greater than
50 Vrms. If a different voltage threshold is required, the
RTEST2 resistor can be adjusted (per the FAN4149
datasheet). Figure 4, Figure 5 and Figure 6 show a
passing self-test cycle. The waveform of channel 4
shows when the Q2 transistor is enabled and a ground
fault is simulated by the current through resistor RTEST2.
The channel 3 waveform shows the gate of the SCR
Q1. Figure 6 shows the pre-bias for the SCR anode
voltage, waveform of channel 1. Figure 6 illustrates that,
when the gate of the SCR is enabled by the controller,
the voltage of the SCR anode is quickly discharged. The
FAN41501
detects
this
and
a
self-test
cycle
is
completed with all of the required components passing.
The Q2 bias is disabled, which causes the GFCI
controller to disable the SCR gate bias.
Note:
5.
Redundant diodes may be required.
If the first self-test cycle passes after power up,
subsequent self-test cycles occur every 90 minutes. At
no time does the FAN41501 disable the normal
controller GFI protection circuitry.
If any one of the above self tests fail, the FAN41501
repeats the self testing until a 66 ms timer expires. If this
occurs, the EOL latch is enabled and the FAN41501
EOL Alarm pin 5 goes HIGH. This signal can be
connected to a separate SCR or to the gate of Q1 with a
series diode. When the EOL Alarm goes HIGH, the SCR
is enabled and energizes the solenoid, which opens the
load contacts. When the EOL Alarm pin goes HIGH, if it
is connected to the gate of an SCR, VDD drops below
2.5 V. This generates a Power-On-Reset that resets the
logic and repeats a self-test cycle in one second. Figure
7 to Figure 10 show a FAN41501 self-test cycle for a
SCR, GFI controller, sense coil, and solenoid failure.


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