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ADC1173CIMTC датащи(PDF) 8 Page - National Semiconductor (TI) |
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ADC1173CIMTC датащи(HTML) 8 Page - National Semiconductor (TI) |
8 / 17 page Typical Performance Characteristics (Continued) Specification Definitions ANALOG INPUT BANDWIDTH is a measure of the fre- quency at which the reconstructed output fundamental drops 3 dB below its low frequency value for a full scale input. The test is performed with f IN equal to 100 KHz plus integer mul- tiples of f CLK. The input frequency at which the output is −3 dB relative to the low frequency input signal is the full power bandwidth. APERTURE JITTER is the time uncertainty of the sampling point (t DS), or the range of variation in the sampling delay. BOTTOM OFFSET is the difference between the input volt- age that just causes the output code to transition to the first code and the negative reference voltage. Bottom offset is defined as E OB = VZT -VRB, where VZT is the first code tran- sition input voltage. Note that this is different from the normal Zero Scale Error. DIFFERENTIAL GAIN ERROR is the percentage difference between the output amplitudes of a high frequency recon- structed sine wave at two different dc levels. DIFFERENTIAL NON-LINEARITY (DNL) is the measure of the maximum deviation from the ideal step size of 1 LSB. DIFFERENTIAL PHASE ERROR is the difference in the out- put phase of a reconstructed small signal sine wave at two different dc levels. EFFECTIVE NUMBER OF BITS (ENOB, or EFFECTIVE BITS) is another method of specifying Signal-to-Noise and Distortion Ratio, or SINAD. ENOB is defined as (SINAD - 1.76) / 6.02 and says that the converter is equivalent to a perfect ADC of this (ENOB) number of bits. INTEGRAL NON-LINEARITY (INL) is a measure of the de- viation of each individual code from a line drawn from zero scale (1⁄2LSB below the first code transition) through positive full scale (1⁄2LSB above the last code transition). The devia- tion of any given code from this straight line is measured from the center of that code value. The end poinnt test method is used. OUTPUT DELAY is the time delay after the rising edge of the input clock before the data update is present at the out- put pins. OUTPUT HOLD TIME is the length of time that the output data is valid after the rise of the input clock. PIPELINE DELAY (LATENCY) is the number of clock cycles between initiation of conversion and the availability of that conversion result at the output. New data is available at ev- ery clock cycle, but the data lags the conversion by the pipe- line delay. SAMPLING (APERTURE) DELAY is that time required after the fall of the clock input for the sampling switch to open. The Sample/Hold circuit effectively stops capturing the input sig- nal and goes into the ″hold″ mode t DS after the clock goes low. SIGNAL TO NOISE RATIO (SNR) is the ratio of the rms value of the input signal to the rms value of the other spectral components below one-half the sampling frequency, not in- cluding harmonics or dc. SIGNAL TO NOISE PLUS DISTORTION (S/(N+D) or SI- NAD) Is the ratio of the rms value of the input signal to the rms value of all of the other spectral components below half the clock frequency, including harmonics but excluding dc. SPURIOUS FREE DYNAMIC RANGE (SFDR) is the differ- ence, expressed in dB, between the rms values of the input signal and the peak spurious signal, where a spurious signal is any signal present in the output spectrum that is not present at the input. TOP OFFSET is the difference between the positive refer- ence voltage and the input voltage that just causes the out- put code to transition to full scale and is defined as E OT = V FT −VRT. Where VFT is the full scale transition input volt- age. Note that this is different from the normal Full Scale Er- ror. TOTAL HARMONIC DISTORTION (THD) is the ratio of the rms total of the first six harmonic components, to the rms value of the input signal. t OD vs Temperature DS100890-25 www.national.com 8 |
Аналогичный номер детали - ADC1173CIMTC |
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Аналогичное описание - ADC1173CIMTC |
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