SN74CB3T3306

SCDS119C – JANUARY 2003 – REVISED DECEMBER 2015

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6 Specifications

6.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)

(1)

MIN

MAX

UNIT

–0.5

7

V

–0.5

7

V

–0.5

7

V

Control input clamp current

–50

mA

I/O port clamp current

–50

mA

±128

mA

±100

mA

Junction temperature

150

°C

Storage temperature

–65

150

°C

(1)

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings

only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended

Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

All voltages are with respect to ground, unless otherwise specified.

(3)

The input and output voltage ratings may be exceeded if the input and output clamp-current ratings are observed.

(4)

(5)

6.2 ESD Ratings

VALUE

UNIT

+2000

Electrostatic

V

discharge

+1000

(1)

JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.

(2)

JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.

6.3 Recommended Operating Conditions

over operating free-air temperature range (unless otherwise noted)

(1)

MIN

MAX

UNIT

Supply voltage

2.3

3.6

V

1.7

5.5

2.7 V

High-level control input voltage

V

2

5.5

3.6 V

0

0.7

2.7 V

Low-level control input voltage

V

0

0.8

3.6 V

Data input and output voltage

0

5.5

V

Operating free-air temperature

–40

85

°C

(1)

Implications of Slow or Floating CMOS Inputs, SCBA004.

4

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