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AD7124-8BCPZ-RL7 датащи(PDF) 10 Page - Analog Devices |
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AD7124-8BCPZ-RL7 датащи(HTML) 10 Page - Analog Devices |
10 / 91 page AD7124-8 Data Sheet Rev. B | Page 10 of 91 Parameter1 Min Typ Max Unit Test Conditions/Comments POWER-DOWN CURRENTS11 Independent of power mode Standby Current IAVDD 7 12 µA LDOs on only IIOVDD 8 17 µA Power-Down Current IAVDD 1 3 µA IIOVDD 1 2 µA 1 Temperature range = −40°C to +105°C. 2 These specifications are not production tested but are supported by characterization data at the initial product release. 3 FS is the decimal equivalent of the FS[10:0] bits in the filter registers. 4 Following a system or internal zero-scale calibration, the offset error is in the order of the noise for the programmed gain and output data rate selected. A system full- scale calibration reduces the gain error to the order of the noise for the programmed gain and output data rate. 5 Recalibration at any temperature removes these errors. 6 Gain error applies to both positive and negative full-scale. A factory calibration is performed at gain = 1, T A = 25°C. 7 When gain > 1, the common-mode voltage is between (AV SS + 0.1 + 0.1/gain) and (AVDD − 0.1 − 0.5/gain). 8 REJ60 is a bit in the filter registers. When the first notch of the sinc filter is at 50 Hz, a notch is placed at 60 Hz when REJ60 is set to 1. This gives simultaneous 50 Hz and 60 Hz rejection. 9 When the gain is greater than 1, the analog input buffers are enabled automatically. The buffers can only be disabled when the gain equals 1. 10 When V REF = (AVDD − AVSS), the typical differential input equals 0.92 × VREF/gain for the low and mid power modes and 0.86 × VREF/gain for full power mode. 11 The digital inputs are equal to IOV DD or DGND with excitation currents and bias voltage generator disabled. TIMING CHARACTERISTICS AVDD = 2.9 V to 3.6 V (full power mode), 2.7 V to 3.6 V (mid and low power mode), IOVDD = 1.65 V to 3.6 V, AVSS = DGND = 0 V, Input Logic 0 = 0 V, Input Logic 1 = IOVDD, unless otherwise noted. Table 3. Parameter1, 2 Min Typ Max Unit Test Conditions/Comments t 3 100 ns SCLK high pulse width t 4 100 ns SCLK low pulse width t 12 Delay between consecutive read/write operations 3/MCLK3 ns Full power mode 12/MCLK ns Mid power mode 24/MCLK ns Low power mode t 13 µs DOUT/RDY high time if DOUT/RDY is low and the next conversion is available 6 µs Full power mode 25 µs Mid power mode 50 µs Low power mode t 14 SYNC low pulse width 3/MCLK ns Full power mode 12/MCLK ns Mid power mode 24/MCLK ns Low power mode READ OPERATION t 1 0 80 ns CS falling edge to DOUT/RDY active time t 2 4 0 80 ns SCLK active edge5 to data valid delay t 5 6, 7 10 80 ns Bus relinquish time after CS inactive edge t 6 0 ns SCLK inactive edge to CS inactive edge t 7 8 SCLK inactive edge to DOUT/RDY high 10 ns The DOUT_RDY_DEL bit is cleared, the CS_EN bit is cleared 110 ns The DOUT_RDY_DEL bit is set, the CS_EN bit is cleared t 7A 7 t 5 ns Data valid after CS inactive edge, the CS_EN bit is set |
Аналогичный номер детали - AD7124-8BCPZ-RL7 |
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Аналогичное описание - AD7124-8BCPZ-RL7 |
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