www.ti.com

FEATURES

PAH PACKAGE

(TOP VIEW)

15 16

4Y3

GND

4Y2

GND

4Y1

GND

GND

3Y3

GND

39

38

37

36

35

34

33

32

31

30

29

28

27

17

1

2

3

4

5

6

7

8

9

10

11

12

13

GND

1Y1

GND

1Y2

GND

1Y3

GND

GND

2Y1

18 19 20 21

51 50 49 48 47

52

46

44 43 42

45

22 23 24 25 26

41 40

14

NC – No internal connection

DESCRIPTION

CDC586

SCAS336E – FEBRUARY 1993 – REVISED APRIL 2004

3.3-V PHASE-LOCK-LOOP CLOCK DRIVER WITH 3-STATE OUTPUTS

•

Application for Synchronous DRAM,

High-Speed Microprocessor

•

Low Output Skew for Clock-Distribution

and Clock-Generation Applications

•

TTL-Compatible Inputs and Outputs

•

•

Outputs Drive Parallel 50-

Ω Terminated

Transmission Lines

•

Distributes One Clock Input to 12

Outputs

•

State-of-the-Art EPIC-IIB™ BiCMOS Design

Significantly Reduces Power Dissipation

•

Two Select Inputs Configure Up to Nine

Outputs to Operate at One-Half or Double

•

the Input Frequency

Switching Noise

•

No External RC Network Required

•

Packaged in 52-Pin Thin Quad Flat Package

•

External Feedback Pin (FBIN) Is Used to

Synchronize the Outputs to the Clock Input

The CDC586 is a high-performance, low-skew, low-jitter clock driver. It uses a phase-lock loop (PLL) to precisely

align, in both frequency and phase, the clock output signals to the clock input (CLKIN) signal. It is specifically

designed for use with popular microprocessors operating at speeds from 50 MHz to 100 MHz or down to 25 MHz

properly terminated 50-W transmission line.

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas

Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

EPIC-IIB is a trademark of Texas Instruments.

PRODUCTION DATA information is current as of publication date.

Copyright © 1993–2004, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.