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LF347-N датащи(PDF) 2 Page - Texas Instruments |
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LF347-N датащи(HTML) 2 Page - Texas Instruments |
2 / 21 page LF147, LF347-N SNOSBH1D – MAY 1999 – REVISED MARCH 2013 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. Absolute Maximum Ratings (1) (2) LF147 LF347B/LF347 Supply Voltage ±22V ±18V Differential Input Voltage ±38V ±30V Input Voltage Range (3) ±19V ±15V Output Short Circuit Duration (4) Continuous Continuous Power Dissipation (5) (6) 900 mW 1000 mW Tj max 150°C 150°C θjA CDIP (J) Package 70°C/W PDIP (NFF) Package 75°C/W SOIC Narrow (D) 100°C/W SOIC Wide (D) 85°C/W Operating Temperature Range See (7) See (7) Storage Temperature Range −65°C≤TA≤150°C Lead Temperature (Soldering, 10 sec.) 260°C 260°C Soldering Information PDIP / CDIP Soldering (10 seconds) 260°C SOIC Package Vapor Phase (60 seconds) 215°C Infrared (15 seconds) 220°C ESD Tolerance (8) 900V (1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is functional, but do not ensure specific performance limits. (2) If Military/Aerospace specified devices are required, please contact the TI Sales Office/Distributors for availability and specifications. (3) Unless otherwise specified the absolute maximum negative input voltage is equal to the negative power supply voltage. (4) Any of the amplifier outputs can be shorted to ground indefinitely, however, more than one should not be simultaneously shorted as the maximum junction temperature will be exceeded. (5) For operating at elevated temperature, these devices must be derated based on a thermal resistance of θjA. (6) Max. Power Dissipation is defined by the package characteristics. Operating the part near the Max. Power Dissipation may cause the part to operate outside ensured limits. (7) The LF147 is available in the military temperature range −55°C≤TA≤125°C, while the LF347B and the LF347 are available in the commercial temperature range 0°C ≤TA≤70°C. Junction temperature can rise to Tj max = 150°C. (8) Human body model, 1.5 k Ω in series with 100 pF. DC Electrical Characteristics (1) (2) Symbol Parameter Conditions LF147 LF347B LF347 Units Min Typ Max Min Typ Max Min Typ Max VOS Input Offset Voltage RS=10 kΩ, TA=25°C 1 5 3 5 5 10 mV Over Temperature 8 7 13 mV ΔVOS/Δ Average TC of Input RS=10 kΩ 10 10 10 μV/°C T Offset Voltage IOS Input Offset Current Tj=25°C, (2) (3) 25 100 25 100 25 100 pA Over Temperature 25 4 4 nA IB Input Bias Current Tj=25°C, (2) (3) 50 200 50 200 50 200 pA Over Temperature 50 8 8 nA RIN Input Resistance Tj=25°C 1012 1012 1012 Ω (1) Refer to RETS147X for LF147D and LF147J military specifications. (2) Unless otherwise specified the specifications apply over the full temperature range and for VS=±20V for the LF147 and for VS=±15V for the LF347B/LF347. VOS, IB, and IOS are measured at VCM=0. (3) The input bias currents are junction leakage currents which approximately double for every 10°C increase in the junction temperature, Tj. Due to limited production test time, the input bias currents measured are correlated to junction temperature. In normal operation the junction temperature rises above the ambient temperature as a result of internal power dissipation, PD. Tj=TA+θjA PD where θjA is the thermal resistance from junction to ambient. Use of a heat sink is recommended if input bias current is to be kept to a minimum. 2 Submit Documentation Feedback Copyright © 1999–2013, Texas Instruments Incorporated Product Folder Links: LF147 LF347-N |
Аналогичный номер детали - LF347-N |
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Аналогичное описание - LF347-N |
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