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LM34 датащи(PDF) 5 Page - Texas Instruments |
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LM34 датащи(HTML) 5 Page - Texas Instruments |
5 / 27 page LM34 www.ti.com SNIS161D – MARCH 2000 – REVISED JANUARY 2016 6.5 Electrical Characteristics: LM34A and LM34CA Unless otherwise noted, these specifications apply: −50°F ≤ TJ ≤ 300°F for the LM34 and LM34A; −40°F ≤ TJ ≤ 230°F for the LM34C and LM34CA; and 32°F ≤ TJ ≤ 212°F for the LM34D. VS = 5 Vdc and ILOAD = 50 µA in the circuit of Full-Range Fahrenheit Temperature Sensor; 6 Vdc for LM34 and LM34A for 230°F ≤ TJ ≤ 300°F. These specifications also apply from 5°F to TMAX in the circuit of Basic Fahrenheit Temperature Sensor (5°F to 300°F). LM34A LM34CA PARAMETER TEST CONDITIONS UNIT MIN TYP MAX MIN TYP MAX Tested Limit(2) –1 1 –1 1 TA = 77°F Design Limit(3) °F ±0.4 ±0.4 Tested Limit T A = 0°F Design Limit –2 2 °F ±0.6 ±0.6 Accuracy(1) Tested Limit –2 2 –2 2 TA = TMAX Design Limit °F ±0.8 ±0.8 Tested Limit –2 2 TA = TMIN Design Limit –3 3 °F ±0.8 ±0.8 Tested Limit Nonlinearity (4) Design Limit –0.7 0.7 –0.6 0.6 °F TA = 77°F ±0.35 ±0.3 Tested Limit 9.9 10.1 Sensor gain (Average Design Limit +9.9 10.1 mV/°F Slope) TA = 77°F +10 10 Tested Limit –1 1 –1 1 TA = 77°F Design Limit mV/mA 0 ≤ IL ≤ 1 mA ±0.4 ±0.4 Load regulation(5) Tested Limit 0 ≤ IL ≤ 1 mA Design Limit –3 3 –3 3 mV/mA ±0.5 ±0.5 Tested Limit –0.05 0.05 –0.05 0.05 TA = 77°F Design Limit mV/V 5 V ≤ VS ≤ 30 V ±0.01 ±0.01 Line regulation(5) Tested Limit 5 V ≤ VS ≤ 30 V Design Limit –0.1 0.1 –0.1 0.1 mV/V ±0.02 ±0.02 (1) Accuracy is defined as the error between the output voltage and 10 mV/°F times the device’s case temperature at specified conditions of voltage, current, and temperature (expressed in °F). (2) Tested limits are specified and 100% tested in production. (3) Design limits are specified (but not 100% production tested) over the indicated temperature and supply voltage ranges. These limits are not used to calculate outgoing quality levels. (4) Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line over the rated temperature range of the device. (5) Regulation is measured at constant junction temperature using pulse testing with a low duty cycle. Changes in output due to heating effects can be computed by multiplying the internal dissipation by the thermal resistance. Copyright © 2000–2016, Texas Instruments Incorporated Submit Documentation Feedback 5 Product Folder Links: LM34 |
Аналогичный номер детали - LM34 |
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Аналогичное описание - LM34 |
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