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LM34 датащи(PDF) 5 Page - Texas Instruments

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номер детали LM34
подробное описание детали  Precision Fahrenheit Temperature Sensors
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LM34 датащи(HTML) 5 Page - Texas Instruments

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LM34
www.ti.com
SNIS161D – MARCH 2000 – REVISED JANUARY 2016
6.5 Electrical Characteristics: LM34A and LM34CA
Unless otherwise noted, these specifications apply:
−50°F ≤ TJ ≤ 300°F for the LM34 and LM34A; −40°F ≤ TJ ≤ 230°F for the
LM34C and LM34CA; and 32°F
≤ TJ ≤ 212°F for the LM34D. VS = 5 Vdc and ILOAD = 50 µA in the circuit of Full-Range
Fahrenheit Temperature Sensor; 6 Vdc for LM34 and LM34A for 230°F
≤ TJ ≤ 300°F. These specifications also apply from
5°F to TMAX in the circuit of Basic Fahrenheit Temperature Sensor (5°F to 300°F).
LM34A
LM34CA
PARAMETER
TEST CONDITIONS
UNIT
MIN
TYP
MAX
MIN
TYP
MAX
Tested Limit(2)
–1
1
–1
1
TA = 77°F
Design Limit(3)
°F
±0.4
±0.4
Tested Limit
T A = 0°F
Design Limit
–2
2
°F
±0.6
±0.6
Accuracy(1)
Tested Limit
–2
2
–2
2
TA = TMAX
Design Limit
°F
±0.8
±0.8
Tested Limit
–2
2
TA = TMIN
Design Limit
–3
3
°F
±0.8
±0.8
Tested Limit
Nonlinearity (4)
Design Limit
–0.7
0.7
–0.6
0.6
°F
TA = 77°F
±0.35
±0.3
Tested Limit
9.9
10.1
Sensor gain (Average
Design Limit
+9.9
10.1
mV/°F
Slope)
TA = 77°F
+10
10
Tested Limit
–1
1
–1
1
TA = 77°F
Design Limit
mV/mA
0
≤ IL ≤ 1 mA
±0.4
±0.4
Load regulation(5)
Tested Limit
0
≤ IL ≤ 1 mA
Design Limit
–3
3
–3
3
mV/mA
±0.5
±0.5
Tested Limit
–0.05
0.05
–0.05
0.05
TA = 77°F
Design Limit
mV/V
5 V
≤ VS ≤ 30 V
±0.01
±0.01
Line regulation(5)
Tested Limit
5 V
≤ VS ≤ 30 V
Design Limit
–0.1
0.1
–0.1
0.1
mV/V
±0.02
±0.02
(1)
Accuracy is defined as the error between the output voltage and 10 mV/°F times the device’s case temperature at specified conditions of
voltage, current, and temperature (expressed in °F).
(2)
Tested limits are specified and 100% tested in production.
(3)
Design limits are specified (but not 100% production tested) over the indicated temperature and supply voltage ranges. These limits are
not used to calculate outgoing quality levels.
(4)
Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line over the rated
temperature range of the device.
(5)
Regulation is measured at constant junction temperature using pulse testing with a low duty cycle. Changes in output due to heating
effects can be computed by multiplying the internal dissipation by the thermal resistance.
Copyright © 2000–2016, Texas Instruments Incorporated
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