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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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LM3429-Q1 датащи(PDF) 4 Page - Texas Instruments |
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LM3429-Q1 датащи(HTML) 4 Page - Texas Instruments |
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4 / 62 page  LM3429, LM3429-Q1 SNVS616H – APRIL 2009 – REVISED JULY 2015 www.ti.com 6 Specifications 6.1 Absolute Maximum Ratings over operating free-air temperature range (unless otherwise noted) (1) (2) MIN MAX UNIT VIN, nDIM –0.3 76 OVP, HSP, HSN –0.3 76 RCT –0.3 3 –0.3 76 IS –2 for 100 ns V Voltage VCC –0.3 8 COMP, CSH –0.3 6 –0.3 VCC GATE –2.5 for 100 ns VCC+2.5 for 100 ns –0.3 0.3 PGND –2.5 2.5 for 100 ns VIN, nDIM –1 mA OVP, HSP, HSN –100 µA RCT –1 5 Continuous Current mA IS –1 COMP, CSH –200 200 µA GATE –1 1 mA Maximum Junction Temperature Internally Limited Maximum Lead Temperature (Reflow and Solder) (3) 260 °C Continuous Power Dissipation Internally Limited Storage Temperature, Tstg –65 150 °C (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) If Military/Aerospace specified devices are required, contact the Texas Instruments Sales Office/Distributors for availability and specifications. (3) Refer to http://www.ti.com/packaging for more detailed information and mounting techniques. 6.2 ESD Ratings VALUE UNIT LM3429 IN PWP PACKAGE Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all pins(1) ±2000 V(ESD) Electrostatic discharge V Charged device model (CDM), per JEDEC specification JESD22-C101, all ±1000 pins(2) LM3429-Q1 IN PWP PACKAGE Human body model (HBM), per AEC Q100-002(3) ±2000 V(ESD) Electrostatic discharge V Charged device model (CDM), per AEC Q100-011 ±1000 (1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. (2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. (3) AEC Q100-002 indicates HBM stressing is done in accordance with the ANSI/ESDA/JEDEC JS-001 specification. 6.3 Recommended Operating Conditions MIN MAX UNIT Operating Junction Temperature Range –40 125 °C Input Voltage VIN 4.5 75 V 4 Submit Documentation Feedback Copyright © 2009–2015, Texas Instruments Incorporated Product Folder Links: LM3429 LM3429-Q1 |
Аналогичный номер детали - LM3429-Q1 |
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Аналогичное описание - LM3429-Q1 |
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