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CAT24C64BAC4CTR датащи(PDF) 2 Page - ON Semiconductor |
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CAT24C64BAC4CTR датащи(HTML) 2 Page - ON Semiconductor |
2 / 9 page CAT24C64BC4, CAT24C64BAC4 www.onsemi.com 2 Table 1. ABSOLUTE MAXIMUM RATINGS Parameters Ratings Units Storage Temperature –65 to +150 °C Voltage on Any Pin with Respect to Ground (Note 1) –0.5 to +6.5 V Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 1. The DC input voltage on any pin should not be lower than −0.5 V or higher than VCC + 0.5 V. During transitions, the voltage on any pin may undershoot to no less than −1.5 V or overshoot to no more than VCC + 1.5 V, for periods of less than 20 ns. Table 2. RELIABILITY CHARACTERISTICS (Note 2) Symbol Parameter Min Units NEND (Note 3) Endurance 1,000,000 Program/Erase Cycles TDR Data Retention 100 Years 2. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC−Q100 and JEDEC test methods. 3. Page Mode, VCC = 5 V, 25°C. Table 3. D.C. OPERATING CHARACTERISTICS (VCC = 1.7 V to 5.5 V, TA = −40°C to +85°C, unless otherwise specified.) Symbol Parameter Test Conditions Min Max Units ICCR Read Current Read, fSCL = 1 MHz 0.4 mA ICCW Write Current Write 0.6 mA ISB Standby Current All I/O Pins at GND or VCC 1 mA IL I/O Pin Leakage Pin at GND or VCC 2 mA VIL Input Low Voltage VCC ≥ 2.2 V −0.5 VCC x 0.3 V VCC < 2.2 V −0.5 VCC x 0.25 V VIH Input High Voltage VCC ≥ 2.2 V VCC x 0.7 VCC + 0.5 V VCC < 2.2 V VCC x 0.75 VCC + 0.5 V VOL Output Low Voltage VCC ≥ 2.2 V, IOL = 3.0 mA 0.4 V VCC < 2.2 V, IOL = 1.0 mA 0.2 V Table 4. PIN IMPEDANCE CHARACTERISTICS (VCC = 1.7 V to 5.5 V, TA = −40°C to +85°C, unless otherwise specified.) Symbol Parameter Conditions Max Units CIN (Note 4) SDA I/O Pin Capacitance VIN = 0 V 8 pF CIN (Note 4) Input Capacitance (other pins) VIN = 0 V 6 pF 4. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC−Q100 and JEDEC test methods. |
Аналогичный номер детали - CAT24C64BAC4CTR |
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Аналогичное описание - CAT24C64BAC4CTR |
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