CAT25128

http://onsemi.com

2

Table 1. ABSOLUTE MAXIMUM RATINGS

Parameters

Ratings

Units

Operating Temperature

−45 to +130

°C

Storage Temperature

−65 to +150

°C

Voltage on any Pin with Respect to Ground (Note 1)

−0.5 to +6.5

V

Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality

should not be assumed, damage may occur and reliability may be affected.

Symbol

Parameter

Min

Units

Endurance

1,000,000

Program / Erase Cycles

Data Retention

100

Years

2. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC−Q100

and JEDEC test methods.

4. The new product revision (E) uses ECC (Error Correction Code) logic with 6 ECC bits to correct one bit error in 4 data bytes. Therefore, when

a single byte has to be written, 4 bytes (including the ECC bits) are re−programmed. It is recommended to write by multiple of 4 bytes in order

to benefit from the maximum number of write cycles.

Table 3. D.C. OPERATING CHARACTERISTICS − MATURE PRODUCT

Symbol

Parameter

Test Conditions

Min

Max

Units

Supply Current

(Read Mode)

SO open

10 MHz / −40°C to 85°C

2

mA

5 MHz / −40°C to 125°C

2

mA

Supply Current

(Write Mode)

SO open

10 MHz / −40°C to 85°C

4

mA

5 MHz / −40°C to 125°C

4

mA

Standby Current

1

mA

3

mA

Standby Current

WP = GND, HOLD = GND,

4

mA

5

mA

Input Leakage Current

−2

2

mA

Output Leakage

Current

−1

1

mA

−1

2

mA

Input Low Voltage

−0.5

V

Input High Voltage

V

Output Low Voltage

0.4

V

Output High Voltage

V

Output Low Voltage

0.2

V

Output High Voltage

V

Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product

performance may not be indicated by the Electrical Characteristics if operated under different conditions.