MC74VHC4316

http://onsemi.com

4

Symbol

Parameter

Test Conditions

V

Guaranteed Limit

Unit

– 55 to

25°C

v 85°C

v 125°C

Minimum High−Level Voltage, Control

or Enable Inputs

2.0

3.0

4.5

6.0

1.5

2.1

3.15

4.2

1.5

2.1

3.15

4.2

1.5

2.1

3.15

4.2

V

Maximum Low−Level Voltage, Control

or Enable Inputs

2.0

3.0

4.5

6.0

0.5

0.9

1.35

1.8

0.5

0.9

1.35

1.8

0.5

0.9

1.35

1.8

V

Maximum Input Leakage Current,

Control or Enable Inputs

6.0

± 0.1

± 1.0

± 1.0

mA

Maximum Quiescent Supply Current

(per Package)

6.0

6.0

2

4

20

40

40

160

mA

NOTE: Information on typical parametric values can be found in Chapter 2 of the ON Semiconductor High−Speed CMOS Data Book

(DL129/D).

Symbol

Parameter

Test Conditions

V

V

Guaranteed Limit

Unit

– 55 to

25°C

v 85°C

v 125°C

Maximum “ON” Resistance

2.0*

4 5

4.5

6.0

0.0

0.0

− 4.5

− 6.0

−

160

90

90

−

200

110

110

−

240

130

130

W

2.0

4.5

4.5

6.0

0.0

0.0

− 4.5

− 6.0

−

90

70

70

−

115

90

90

−

140

105

105

Maximum Difference in “ON”

Resistance Between Any Two

Channels in the Same Package

2.0

4.5

4.5

6.0

0.0

0.0

– 4.5

– 6.0

−

20

15

15

−

25

20

20

−

30

25

25

W

Maximum Off−Channel

Leakage Current, Any One

Channel

Switch Off (Figure 3)

6.0

– 6.0

0.1

0.5

1.0

mA

Maximum On−Channel

Leakage Current, Any One

Channel

(Figure 4)

6.0

– 6.0

0.1

0.5

1.0

mA

NOTE: Information on typical parametric values can be found in Chapter 2 of the ON Semiconductor High−Speed CMOS Data Book

(DL129/D).

operation, it is recommended that these devices only be used to control digital signals.