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SI4356 датащи(PDF) 6 Page - Silicon Laboratories

номер детали SI4356
подробное описание детали  Pin configurable
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производитель  SILABS [Silicon Laboratories]
домашняя страница  http://www.silabs.com
Logo SILABS - Silicon Laboratories

SI4356 датащи(HTML) 6 Page - Silicon Laboratories

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Si4356
6
Rev 1.2
Table 5. Digital I/O Specifications (STBY, RX_DATA, MSTAT, CLK_OUT)1
Parameter
Symbol
Test Condition
Min
Typ
Max
Unit
Rise Time
TRISE
0.1xVDD to 0.9xVDD,
CL=10pF, DRV<1:0≥HH
—2.3
ns
Fall Time
TFALL
0.9xVDD to 0.1xVDD,
CL=10pF, DRV<1:0≥HH
—2.0
ns
Input Capacitance
CIN
—–
2
pF
Logic High Level Input
Voltage
VIH
—VDDx0.7
V
Logic Low Level Input
Voltage
VIL
——
VDDx0.3
V
Input Current (STBY)2
IIN
0<VIN<VDD
–10
10
µA
Input Current (STBY)2
IINP
VIL = 0 V
1
10
µA
Drive Strength for Out-
put Low Level2, 3
IOL
RX_DATA, MSTAT, CLK_OUT
1.13
mA
Drive Strength for Out-
put High Level2, 3
IOH
RX_DATA, MSTAT
0.96
mA
Drive Strength for Out-
put High Level2, 3
IOH
CLK_OUT
0.80
mA
Logic High Level Out-
put Voltage
VOH
IOUT = 500 µA
VDDx0.8
V
Logic Low Level Out-
put Voltage
VOL
IOUT = 500 µA
VDDx0.2
V
CLK_OUT Frequency
FCLK
Rx Freq = 315 MHZ
10
MHz
All other frequencies
15
MHz
CLK_OUT Duty Cycle
50
%
Notes:
1.
Guaranteed by qualification. Qualification test conditions are listed in Section “1.1. Definition of Test Conditions”.
2.
Currents listed are during normal operation after power up sequence is complete.
3.
Output currents measured at 3.3 VDC VDD with VOH = 2.64 VDC and VOL = 0.66 VDC.
Table 6. Thermal Characteristics
Parameter
Symbol
Test Condition
Value
Unit
Thermal Resistance Junction to Ambient
JA
Still Air
30
C/W


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