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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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IIS328DQ датащи(PDF) 14 Page - STMicroelectronics |
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IIS328DQ датащи(HTML) 14 Page - STMicroelectronics |
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14 / 40 page  Mechanical and electrical specifications IIS328DQ 14/40 DocID027250 Rev 3 2.5.2 Zero-g level Zero-g level offset (TyOff) describes the deviation of an actual output signal from the ideal output signal if no acceleration is present. A sensor in a steady-state on a horizontal surface measures 0 g on the X-axis and 0 g on the Y-axis, whereas the Z-axis measures 1 g. The output is ideally in the center of the dynamic range of the sensor (the content of the OUT registers is 00h, data expressed as 2’s complement number). A deviation from the ideal value in this case is called zero-g offset. Offset is, to some extent, a result of stress to the MEMS sensor and therefore the offset can slightly change after mounting the sensor onto a printed circuit board or exposing it to extensive mechanical stress. Offset changes little over temperature, see “Zero-g level change vs. temperature” in Table 3. The zero-g level tolerance (TyOff) describes the standard deviation of the range of zero-g levels of a population of sensors. 2.5.3 Self-test Self-test allows the sensor functionality to be tested without moving it. The self-test function is off when the self-test bit (ST) of CTRL_REG4 (control register 4) is programmed to ‘0‘. When the self-test bit of CTRL_REG4 is programmed to ‘1’, an actuation force is applied to the sensor, simulating a definite input acceleration. In this case, the sensor outputs exhibit a change in their DC levels which are related to the selected full scale through the device sensitivity. When the self-test is activated, the device output level is given by the algebraic sum of the signals produced by the acceleration acting on the sensor and by the electrostatic test force. If the output signals change within the amplitude specified in Table 3, then the sensor is working properly and the parameters of the interface chip are within the defined specifications. 2.5.4 Sleep-to-wakeup The “sleep-to-wakeup” function, in conjunction with low-power mode, allows further reduction of system power consumption and development of new smart applications. The IIS328DQ may be set to a low-power operating mode, characterized by lower data rate refresh. In this way the device, even if sleeping, continues to sense acceleration and to generate interrupt requests. When the “sleep-to-wakeup” function is activated, the IIS328DQ is able to automatically wake up as soon as the interrupt event has been detected, increasing the output data rate and bandwidth. With this feature, the system may be efficiently switched from low-power mode to full- performance depending on user-selectable positioning and acceleration events, therefore ensuring power saving and flexibility. |
Аналогичный номер детали - IIS328DQ |
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Аналогичное описание - IIS328DQ |
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