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HCPL-1930 датащи(PDF) 7 Page - Broadcom Corporation. |
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HCPL-1930 датащи(HTML) 7 Page - Broadcom Corporation. |
7 / 13 page Broadcom - 7 - HCPL-1930, HCPL-1931, HCPL-193K, 5962-89572 Data Sheet Typical Specifications TA = 25°C, VCC = 5V. Propagation Delay Time to Low Output Level tPHL RL = 510Ω; CL = 50 pF, II = 13 mA, VCC = 5.0V 9 — 60 100 ns 4, 5 c, g 10, 11 — — 120 Common Mode Transient Immunity at High Output Level |CMH| VCM = 50V (peak), VO (min.) = 2V, RL = 510Ω; II = 0 mA, VCC = 5.0V 9, 10, 11 1000 10,000 — V/μs 8, 9 c, h, i Common Mode Transient Immunity at Low Output Level |CML| VCM = 50V (peak), VO (max.) = 0.8V, RL = 510Ω; II = 10 mA, VCC = 5.0V 9, 10, 11 1000 10,000 — V/μs 8, 9 c, j, i a. Commercial parts receive 100% testing at 25°C (Subgroups 1 and 9). Class H and K parts receive 100% testing at 25, 125, and -55° C (Subgroups 1 and 9, 2 and 10, 3 and 11, respectively). b. All typical values are at VCC = 5V, TA = 25°C. c. Each channel. d. No external pull-up is required for a high logic state on the enable input. e. Device considered a two terminal device: pins 1 through 8 are shorted together, and pins 9 through 16 are shorted together. f. The tPLH propagation delay is measured from the 6.5-mA point on the trailing edge of the input pulse to the 1.5V point on the trailing edge of the output pulse. g. The tPHL propagation delay is measured from the 6.5-mA point on the leading edge of the input pulse to the 1.5V point on the leading edge of the output pulse. h. CMH is the maximum tolerable rate of rise of the common mode voltage to assure that the output remains in a high logic state, i.e., VOUT > 2.0V. i. Parameters shall be tested as part of device initial characterization and after process changes. Parameters shall be guaranteed to the limits specified for all lots not specifically tested. j. CML is the maximum tolerable rate of fall of the common mode voltage to assure that the output remains in a low logic state, i.e., VOUT < 0.8V. Parameter Symbol Typ Unit Test Conditions Fig. Note Resistance (Input-Output) RI-O 1012 ΩVI-O = 500 Vdc a, b a. Each channel. b. Measured between pins 1 and 2 or 5 and 6 shorted together, and pins 10 through 15 shorted together. Capacitance (Input-Output) CI-O 1.7 pF f = 1 MHz a, b Input-Input Insulation Leakage Current II-I 0.5 nA ≤65% Relative Humidity, VI-I = 500 Vdc, t = 5s c c. Measured between adjacent input leads shorted together, i.e., between 1, 2, and 4 shorted together and pins 5, 6, and 8 shorted together. Resistance (Input-Input) RI-I 1012 Ω VI-I = 500 Vdc c Capacitance (Input-Input) CI-I 0.55 pF f = 1 MHz c Propagation Delay Time of Enable from VEH to VEL tELH 35 ns RL = 510Ω, CL = 15 pF, II = 13 mA, VEH = 3V, VEL = 0V 6, 7 a, d d. The tELH enable propagation delay is measured from the 1.5V point on the trailing edge of the enable input pulse to the 1.5V point on the trailing edge of the output pulse. Propagation Delay Time of Enable from VEL to VEH tEHL 35 ns 6, 7 a, e e. The tEHL enable propagation delay is measured from the 1.5V point on the leading edge of the enable input pulse to the 1.5V point on the leading edge of the output pulse. Output Rise Time (10% to 90%) tr 30 ns RL = 510Ω, CL = 15 pF, II = 13 mA a Output Fall Time (90% to 10%) tf 24 ns a Input Capacitance CI 60 pF f = 1 MHz, VI = 0, PINS 1 to 2 or 5 to 6 a Parameter Symbol Test Conditions Group A Subgroupsa Limits Unit Fig Note Min Typb Max |
Аналогичный номер детали - HCPL-1930 |
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Аналогичное описание - HCPL-1930 |
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