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HCPL-1930 датащи(PDF) 7 Page - Broadcom Corporation.

номер детали HCPL-1930
подробное описание детали  Dual-Channel Line Receiver Hermetically Sealed Optocoupler
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производитель  BOARDCOM [Broadcom Corporation.]
домашняя страница  http://www.broadcom.com
Logo BOARDCOM - Broadcom Corporation.

HCPL-1930 датащи(HTML) 7 Page - Broadcom Corporation.

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Broadcom
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HCPL-1930, HCPL-1931, HCPL-193K, 5962-89572
Data Sheet
Typical Specifications
TA = 25°C, VCC = 5V.
Propagation Delay Time to Low
Output Level
tPHL
RL = 510Ω; CL = 50 pF,
II = 13 mA, VCC = 5.0V
9
60
100
ns
4, 5
c, g
10, 11
120
Common Mode Transient Immunity
at High Output Level
|CMH|
VCM = 50V (peak),
VO (min.) = 2V, RL = 510Ω;
II = 0 mA, VCC = 5.0V
9, 10, 11
1000
10,000
V/μs
8, 9
c, h, i
Common Mode Transient Immunity
at Low Output Level
|CML|
VCM = 50V (peak),
VO (max.) = 0.8V,
RL = 510Ω; II = 10 mA,
VCC = 5.0V
9, 10, 11
1000
10,000
V/μs
8, 9
c, j, i
a.
Commercial parts receive 100% testing at 25°C (Subgroups 1 and 9). Class H and K parts receive 100% testing at 25, 125, and -55° C (Subgroups 1 and 9, 2 and
10, 3 and 11, respectively).
b.
All typical values are at VCC = 5V, TA = 25°C.
c.
Each channel.
d.
No external pull-up is required for a high logic state on the enable input.
e.
Device considered a two terminal device: pins 1 through 8 are shorted together, and pins 9 through 16 are shorted together.
f.
The tPLH propagation delay is measured from the 6.5-mA point on the trailing edge of the input pulse to the 1.5V point on the trailing edge of the output pulse.
g.
The tPHL propagation delay is measured from the 6.5-mA point on the leading edge of the input pulse to the 1.5V point on the leading edge of the output
pulse.
h.
CMH is the maximum tolerable rate of rise of the common mode voltage to assure that the output remains in a high logic state, i.e., VOUT > 2.0V.
i.
Parameters shall be tested as part of device initial characterization and after process changes. Parameters shall be guaranteed to the limits specified for all
lots not specifically tested.
j.
CML is the maximum tolerable rate of fall of the common mode voltage to assure that the output remains in a low logic state, i.e., VOUT < 0.8V.
Parameter
Symbol
Typ
Unit
Test Conditions
Fig.
Note
Resistance (Input-Output)
RI-O
1012
ΩVI-O = 500 Vdc
a, b
a.
Each channel.
b.
Measured between pins 1 and 2 or 5 and 6 shorted together, and pins 10 through 15 shorted together.
Capacitance (Input-Output)
CI-O
1.7
pF
f = 1 MHz
a, b
Input-Input Insulation Leakage Current
II-I
0.5
nA
≤65% Relative Humidity,
VI-I = 500 Vdc, t = 5s
c
c.
Measured between adjacent input leads shorted together, i.e., between 1, 2, and 4 shorted together and pins 5, 6, and 8 shorted together.
Resistance (Input-Input)
RI-I
1012
Ω
VI-I = 500 Vdc
c
Capacitance (Input-Input)
CI-I
0.55
pF
f = 1 MHz
c
Propagation Delay Time of Enable from VEH to VEL
tELH
35
ns
RL = 510Ω, CL = 15 pF,
II = 13 mA, VEH = 3V, VEL = 0V
6, 7
a, d
d.
The tELH enable propagation delay is measured from the 1.5V point on the trailing edge of the enable input pulse to the 1.5V point on the trailing edge of the
output pulse.
Propagation Delay Time of Enable from VEL to VEH
tEHL
35
ns
6, 7
a, e
e.
The tEHL enable propagation delay is measured from the 1.5V point on the leading edge of the enable input pulse to the 1.5V point on the leading edge of
the output pulse.
Output Rise Time (10% to 90%)
tr
30
ns
RL = 510Ω, CL = 15 pF, II = 13 mA
a
Output Fall Time (90% to 10%)
tf
24
ns
a
Input Capacitance
CI
60
pF
f = 1 MHz, VI = 0, PINS 1 to 2 or 5 to 6
a
Parameter
Symbol
Test Conditions
Group A
Subgroupsa
Limits
Unit
Fig
Note
Min
Typb
Max


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