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TLP350 датащи(PDF) 4 Page - Toshiba Semiconductor |
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TLP350 датащи(HTML) 4 Page - Toshiba Semiconductor |
4 / 6 page TLP350 2003-10-27 4 Switching Characteristics (Ta ==== −−−−40 to 100°C, unless otherwise specified) Characteristics Symbol Test Circuit Test Condition Min Typ.* Max Unit L → H tpLH IF = 0 → 5 mA 50 250 500 Propagation delay time H → L tpHL VCC 1= +15 V VEE 1= -15 V Rg = 20 Ω Cg = 10 nF IF = 5 → 0 mA 50 250 500 ns Propagation delay difference between any two parts or channels PDD |tpHL-tpLH| VCC 1= +15 V , VEE 1= -15 V, Rg = 20 Ω, Cg = 10 nF 450 ns Output rise time (10-90%) tr IF = 0 → 5 mA Output fall time (90-10%) tf 7 VCC 1= +15 V VEE 1= -15 V Rg = 20 Ω Cg = 10 nF IF = 5 → 0 mA ns Common mode transient immunity at hight level output CMH IF = 5 mA VO (min) =26V −15000 Common mode transient immunity at low level output CML 8 VCM = 1000 Vp-p Ta = 25°C VCC = 30 V IF = 0 mA VO (max) =1V 15000 V/ µs *: All typical values are at Ta = 25°C Test Circuit 1: IOPH Test Circuit 2: IOPL Test Circuit 3: VOH Test Circuit 4: VOL Test Circuit 5: ICCH Test Circuit 6: ICCL IF A 1 4 5 8 IOPH V8-6 VCC 1 4 5 8 VCC IF A ICCH 1 4 5 8 VCC A ICCL A 1 4 5 8 IOPL V6-5 VCC V 1 4 5 8 IF VOH VEE1 VCC1 1 4 5 8 VOL VCC1 V VF VEE1 |
Аналогичный номер детали - TLP350 |
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Аналогичное описание - TLP350 |
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