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74F534 датащи(PDF) 6 Page - NXP Semiconductors |
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74F534 датащи(HTML) 6 Page - NXP Semiconductors |
6 / 12 page Philips Semiconductors Product specification 74F533,* 74F534 Latch/flip-flop 1999 Jan 08 6 * Discontinued part. Please see the Discontinued Products List. DC ELECTRICAL CHARACTERISTICS (Over recommended operating free-air temperature range unless otherwise noted.) SYMBOL PARAMETER TEST CONDITIONS1 LIMITS UNIT SYMBOL PARAMETER TEST CONDITIONS1 MIN TYP2 MAX UNIT VO High level output voltage VCC = MIN, VIL = MAX, ±10%VCC 2.4 V VOH High-level output voltage VCC MIN, VIL MAX, VIH = MIN, IOH = MAX ±5%VCC 2.7 3.3 V VO Low level output voltage VCC = MIN, VIL = MAX, ±10%VCC 0.35 0.50 V VOL Low-level output voltage VCC MIN, VIL MAX, VIH = MIN, IOL = MAX ±5%VCC 0.35 0.50 V VIK Input clamp voltage VCC = MIN, II = IIK –0.73 –1.2 V II Input current at maximum input voltage VCC = MAX, VI = 7.0V 100 µA IIH High-level input current VCC = MAX, VI = 2.7V 20 µA IIL Low-level input current VCC = MAX, VI = 0.5V –0.6 mA IOZH Off-state output current, High-level voltage applied VCC = MAX, VO = 2.7V 50 µA IOZL Off-state output current, Low-level voltage applied VCC = MAX, VO = 0.5V –50 µA IOS Short-circuit output current3 VCC = MAX –60 –150 mA ICC Supply current (total) 74F533 VCC = MAX OE=4.5V, Dn=E=GND 41 61 mA ICC Supply current (total) 74F534 VCC = MAX OE=4.5V, Dn=GND 51 86 mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. AC ELECTRICAL CHARACTERISTICS LIMITS SYMBOL PARAMETER TEST CONDITIONS Tamb= +25°C VCC = +5V CL = 50pF, RL = 500Ω Tamb = 0°C to +70°C VCC = +5V ± 10% CL = 50pF, RL = 500Ω UNIT MIN TYP MAX MIN MAX tPLH tPHL Propagation delay Dn to Qn Waveform 2 4.0 3.0 6.0 4.5 8.5 7.0 4.0 3.0 9.5 8.0 ns tPLH tPHL Propagation delay E to Qn 74F533 Waveform 3 5.0 3.0 6.5 4.5 9.5 7.0 5.0 3.0 10.0 8.0 ns tPZH tPZL Output Enable time to High or Low level 74F533 Waveform 6 Waveform 7 2.0 2.0 4.5 5.0 7.0 7.0 2.0 2.0 8.0 8.0 ns tPHZ tPLZ Output Disable time from High or Low level Waveform 6 Waveform 7 2.0 2.0 3.5 3.0 6.0 5.5 2.0 2.0 7.0 6.5 ns fMAX Maximum Clock frequency Waveform 1 150 165 135 MHz tPLH tPHL Propagation delay CP to Qn Waveform 1 3.0 3.0 4.5 4.5 7.0 7.0 2.5 2.5 7.5 7.5 ns tPZH tPZL Output Enable time to High or Low level 74F534 Waveform 6 Waveform 7 2.0 2.0 4.5 5.0 7.5 7.5 2.0 2.0 8.5 8.5 ns tPHZ tPLZ Output Disable time from High or Low level Waveform 6 Waveform 7 2.0 2.0 3.5 3.5 6.5 5.5 2.0 2.0 7.5 6.5 ns |
Аналогичный номер детали - 74F534 |
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Аналогичное описание - 74F534 |
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