TC58DVM92A1FT00

2003-01-10

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Power supply

Program/Erase Cycles 1E5 cycle (with ECC)

Access time

Cell array to register 25 s max

Serial Read Cycle

50 ns min

Operating current

Read (50 ns cycle)

10 mA typ.

Program (avg.)

10 mA typ.

Erase (avg.)

10 mA typ.

Standby

50 A max.

Package

TSOPI48-P-1220-0.50 (Weight: 0.53g typ.)

TENTATIVE

TOSHIBA MOS DIGITAL INTEGRATED CIRCUIT SILICON GATE CMOS

512-MBIT (64M

8 BITS) CMOS NAND E

2

PROM

DESCRIPTION

The device is a single 3.3 V 1-Gbit (553,648,128) bit NAND Electrically Erasable and Programmable Read-Only

which allows program and read data to be transferred between the register and the memory cell array in 528-byte

increments. The Erase operation is implemented in a single block unit (16 Kbytes 512 bytes: 528 bytes 32 pages).

The device is a serial-type memory device which utilizes the I/O pins for both address and data input/output as

well as for command inputs. The Erase and Program operations are automatically executed making the device most

suitable for applications such as solid-state file storage, voice recording, image file memory for still cameras and

other systems which require high-density non-volatile memory data storage.

FEATURES

Organization

Memory cell allay 528 128K 8

Register

528 8

Page size

528 bytes

Block size

(16K 512) bytes

Modes

Read, Reset, Auto Page Program,

Auto Block Erase, Status Read,

Multi Block Program, Multi Block Erase

Mode control

Serial input/output

Command control

PIN NAMES

I/O1 to I/O8

I/O port

CE

Chip enable

WE

Write enable

RE

Read enable

CLE

Command latch enable

ALE

Address latch enable

WP

Write protect

BY

/

RY

Ready/Busy

GND

Ground input

Power supply

Ground

TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general

can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer,

when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid

situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to

property.

In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most

recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide

for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc..

The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal

equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). These TOSHIBA products are

neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or

failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control

instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control

instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this document

shall be made at the customer’s own risk.

The products described in this document are subject to the foreign exchange and foreign trade laws.

The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by

TOSHIBA CORPORATION for any infringements of intellectual property or other rights of the third parties which may result from its

use. No license is granted by implication or otherwise under any intellectual property or other rights of TOSHIBA CORPORATION or

others.

The information contained herein is subject to change without notice.

000707EBA1

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48

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25

NC

NC

NC

NC

I/O8

I/O7

I/O6

I/O5

NC

NC

NC

NC

NC

NC

I/O4

I/O3

I/O2

I/O1

NC

NC

NC

NC

NC

NC

NC

NC

NC

GND

BY

/

RY

RE

CE

NC

NC

NC

NC

CLE

ALE

WE

WP

NC

NC

NC

NC

NC