MC100LVELT23

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3

Table 3. MAXIMUM RATINGS

Symbol

Parameter

Condition 1

Condition 2

Rating

Unit

PECL Power Supply

GND = 0 V

3.8

V

Input Voltage

GND = 0 V,

3.8

V

Output Current

Continuous

Surge

50

100

mA

Operating Temperature Range

−40 to +85

°C

Storage Temperature

−65 to +150

°C

Thermal Resistance (Junction−to−Ambient)

0 lfpm

500 lfpm

SOIC−8

SOIC−8

190

130

°C/W

°C/W

Thermal Resistance (Junction−to−Case)

Standard Board

SOIC−8

41 to 44 ± 5%

°C/W

Thermal Resistance (Junction−to−Ambient)

0 lfpm

500 lfpm

TSSOP−8

TSSOP−8

185

140

°C/W

°C/W

Thermal Resistance (Junction−to−Case)

Standard Board

TSSOP−8

41 to 44 ± 5%

°C/W

Thermal Resistance (Junction−to−Ambient)

0 lfpm

500 lfpm

DFN8

DFN8

129

84

°C/W

°C/W

Wave Solder

Pb

Pb−Free

<2 to 3 sec @ 248°C

<2 to 3 sec @ 260°C

265

265

°C

Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the

Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect

device reliability.

Symbol

Characteristic

−40°C

25°C

85°C

Min

Typ

Max

Min

Typ

Max

Min

Typ

Max

Unit

Power Supply Current (Outputs set to HIGH)

10

18

25

10

18

25

10

18

25

mA

Power Supply Current (Outputs set to LOW)

15

26

36

15

26

36

15

26

36

mA

Input HIGH Voltage (Note 4)

2135

2420

2135

2420

2135

2420

mV

Input LOW Voltage (Note 4)

1490

1825

1490

1825

1490

1825

mV

Input HIGH Voltage Common Mode Range

(Notes 3 and 4)

1.2

1.2

1.2

V

Input HIGH Current

150

150

150

mA

Input LOW Current

D −150

−150

−150

mA

NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit

board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared

operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit

values are applied individually under normal operating conditions and not valid simultaneously.