MC10114

http://onsemi.com

4

TEST VOLTAGE VALUES (Volts)

@ Test Temperature

–30

°C

+0.110

–0.890

–1.890

–2.890

–5.2

+25

°C

+0.190

–0.850

–1.810

–2.850

–5.2

+85

°C

+0.300

–0.825

–1.700

–2.825

–5.2

Pin

Under

TEST VOLTAGE APPLIED TO PINS LISTED BELOW

(V

)

Characteristic

Symbol

Under

Test

Gnd

Power Supply Drain Current

8

8

1, 16

Input Current

4

8

1, 16

4

8, 4

1, 16

Output Voltage

Logic 1

2

3

8

8

1, 16

1, 16

Output Voltage

Logic 0

2

3

8

8

1, 16

1, 16

Threshold Voltage

Logic 1

2

3

8

8

1, 16

1, 16

Threshold Voltage

Logic 0

2

3

8

8

1, 16

1, 16

Reference Voltage

11

8

1, 16

Common Mode Rejection Test

2

3

4

5

5

4

8

8

1, 16

1, 16

2

3

4

5

5

4

8

8

1, 16

1, 16

Switching Times

(50

Ω Load)

–3.2 V

+2.0 V

Propagation Delay

2

2

3

3

8

8

8

8

1, 16

1, 16

1, 16

1, 16

Rise Time

(20 to 80%)

2

3

8

8

1, 16

1, 16

Fall Time

(20 to 80%)

2

3

8

8

1, 16

1, 16

Each MECL 10,000 series circuit has been designed to meet the dc specifications shown in the test table, after thermal equilibrium has been

established. The circuit is in a test socket or mounted on a printed circuit board and transverse air flow greater than 500 linear fpm is maintained.

Outputs are terminated through a 50-ohm resistor to –2.0 volts. Test procedures are shown for only one gate. The other gates are tested in the

same manner.