MC10EL07D datasheet(1/20 Pages) ONSEMI

номер детали	MC10EL07D

подробное описание детали	Evaluation Board Manual for High Frequency SOIC 8

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August, 2004 − Rev. 1

1

Publication Order Number:

ECLSOIC8EVB/D

ECLSOIC8EVB

Evaluation Board Manual

for High Frequency SOIC 8

INTRODUCTION

ON Semiconductor has developed an evaluation board for

the devices in 8−lead SOIC package. These evaluation

boards are offered as a convenience for the customers

interested in performing their own engineering assessment

on the general performance of the 8−lead SOIC device

samples. The board provides a high bandwidth 50

W

controlled impedance environment. The pictures in Figure 1

show the top and bottom view of the evaluation board, which

can be configured in several different ways, depending on

device under test (See Table 1. Configuration List).

This evaluation board manual contains:

• Information on 8−lead SOIC Evaluation Board

• Assembly Instructions

• Appropriate Lab Setup

• Bill of Materials

This manual should be used in conjunction with the device

data sheet, which contains full technical details on the device

specifications and operation.

Board Lay−Up

The 8−lead SOIC evaluation board is implemented in four

layers with split (dual) power supplies (Figure 2.

Evaluation Board Lay−up). For standard ECL lab setup and

test, a split (dual) power supply is essential to enable the

50

W internal impedance in the oscilloscope as a termination

for ECL devices. The first layer or primary trace layer is

0.008

″ thick Rogers RO4003 material, which is designed to

have equal electrical length on all signal traces from the

device under the test (DUT) to the sense output. The second

layer is the 1.0 oz copper ground plane and a portion of the

plane is the VEE power plane. The FR4 dielectric material is

placed between second and third layer and between third and

fourth layer. The third layer is also 1.0 oz copper ground

plane and a portion of this layer is VCC power plane. The

fourth layer is the secondary trace layer.

Figure 1. Top and Bottom View of the 8−lead SOIC Evaluation Board

EVALUATION BOARD MANUAL

http://onsemi.com

Аналогичный номер детали - MC10EL07D

производитель	номер детали	датащи	подробное описание детали
ON Semiconductor	MC10EL07D	71Kb / 2P	2-Input XOR/XNOR 1996 REV 2
	MC10EL07D	145Kb / 9P	5.0 V ECL 2-Input XOR/XNOR December, 2006 ??Rev. 6
	MC10EL07DG	145Kb / 9P	5.0 V ECL 2-Input XOR/XNOR December, 2006 ??Rev. 6
	MC10EL07DG	157Kb / 7P	5.0 V ECL 2?륤nput XOR/XNOR July, 2016 ??Rev. 8
	MC10EL07DR2	71Kb / 2P	2-Input XOR/XNOR 1996 REV 2

More results

Аналогичное описание - MC10EL07D

производитель	номер детали	датащи	подробное описание детали
ON Semiconductor	ECLSOIC8EVB	201Kb / 20P	Evaluation Board Manual for High Frequency SOIC 8 August, 2004 ??Rev. 1
	ECLLQFP32EVB	238Kb / 22P	Evaluation Board Manual for High Frequency LQFP32 April, 2003 - Rev. 1
	ECLTSSOP20EVB	188Kb / 18P	Evaluation Board Manual for High Frequency TSSOP 20 May, 2003 - Rev. 1
	NB4N527SMNEVB	321Kb / 8P	Evaluation Board Manual for NB4N527S September, 2008 ??Rev. 1
	NBSG111BAEVB	355Kb / 12P	Evaluation Board Manual for NBSG111 October, 2003 ??Rev. 0
Sipex Corporation	SP6660EB	35Kb / 6P	Evaluation Board Manual
	SP6661EB	51Kb / 5P	Evaluation Board Manual
	SP504EB	132Kb / 18P	Evaluation Board Manual
Motorola, Inc	MC145192EVK	282Kb / 48P	Evaluation Board Manual
Sipex Corporation	SP6126	375Kb / 8P	Evaluation Board Manual

More results

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Аналогичный номер детали - MC10EL07D

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