поискавой системы для электроныых деталей |
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TLP2200 датащи(PDF) 5 Page - Toshiba Semiconductor |
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TLP2200 датащи(HTML) 5 Page - Toshiba Semiconductor |
5 / 7 page TLP2200 2007-10-01 5 Test Circuit 1 tpHL, tpLH, tr and tf Test Circuit 2 tpHZ, tpZH, tpLZ and tpZL Output VO IF(ON) 50% 0mA 10% 90% Input IF tpLH tpHL VOH VOL tr tf 1.3V C1 is peaking capacitor. The probe and jig capacitances are include in C1. CL is approximately 15pF which includes probe and stray wiring capacitance. R1 2.15kΩ 1.1kΩ 681Ω IF(ON) 1.6mA 3mA 5mA VCC GND Input Monitoring Node 1 2 3 4 8 7 6 5 VCC D2 D3 D4 D1 CL C1=120pF Output VO Monitoring Node D1~D4 1S1588 5V : R1 Pulse Generator tr = tf = 5ns VO = 5V Output VO IF=IF (ON) Input VE Output VO IF=IF (OFF) S1 Open S2 Closed S1 Closed S2 Open tPZL 1.3V 0V tPHZ tPZH 0.5V 1.3V tPLZ 0.5V S1 and S2 Closed 3.0V 1.3V 0V S1 and S2 Closed VOH 1.5V VOL ~~ CL is approximately 15pF which includes probe and stray wiring capacitance. VCC GND Input VE Monitoring Node 1 2 3 4 8 7 6 5 VCC D2 D3 D4 D1 CL VO D1~D4 1S1588 5V : IF Pulse Generator ZO = 50Ω tr = tf = 5ns S2 S1 |
Аналогичный номер детали - TLP2200_07 |
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Аналогичное описание - TLP2200_07 |
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