TA76432AFT/AF/AFR/AS

2006-11-07

3

Typical Application Circuits

Precautions during Use

(1)

TA76432AFT, TA76432AF/AFR, TA76432AS

These products contain MOS elements. Please take care to avoid generating static electricity when

handling these devices.

(2)

TA76432AFT, TA76432AF/AFR, TA76432AS

The oscillation frequency of these devices is determined by the value of the capacitor connected between

the anode and the cathode.

When establishing maximum operating condition parameters, please derate the maximum rating values

specified in these datasheets so as to allow an operational safety margin.

Use of a laminated ceramic capacitor is recommended.

(3)

Precautions when handling anode pin of TA76432AFT

Pin 2 and pin 5 should normally be shorted together. If only pin 5 is used, pin 2 should either be left open

or always kept at a lower potential than pin 5. Do not leave pin 5 open and use pin 2 only.

Characteristics

Symbol

Rating

Unit

Cathode voltage

20

V

Cathode current

20

mA

Cathode-anode reverse current

10

mA

Reference voltage

7

V

Reference current

50

μA

Reference-anode reverse current

10

mA

TA76432AFT

0.45 (Note 1)

TA76432AF/AFR

0.5

Power dissipation

TA76432AS

0.8

W

TA76432AFT

277 (Note 1)

TA76432AF/AFR

250

Thermal

resistance

TA76432AS

156

ºC/W

Operating temperature

−40∼85

ºC

Junction temperature

150

ºC

Storage temperature

−55∼150

ºC

Note 1: Glass epoxy board mounting: 30 mm

× 30 mm × 0.8 mmt (Cu pad area 35 mm

2

)

Note 2: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the

significant change in temperature, etc.) may cause this product to decrease in the reliability significantly

even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute

maximum ratings and the operating ranges.

Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook

(“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test

report and estimated failure rate, etc).

R1

I

R

R

1

V

REF

2

1

REF

⋅

+

⎟⎟

⎠

⎞

⎜⎜

⎝

⎛

+

=

R1

R2