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NBXDBA014LN1TAG датащи(PDF) 4 Page - ON Semiconductor |
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NBXDBA014LN1TAG датащи(HTML) 4 Page - ON Semiconductor |
4 / 6 page NBXDBA014 http://onsemi.com 4 Table 8. RELIABILITY COMPLIANCE Parameter Standard Method Shock Mechanical MIL-STD-833, Method 2002, Condition B Solderability Mechanical MIL-STD-833, Method 2003 Vibration Mechanical MIL-STD-833, Method 2007, Condition A Solvent Resistance Mechanical MIL-STD-202, Method 215 Resistance to Soldering Heat Mechanical MIL-STD-203, Method 210, Condition I or J Thermal Shock Environment MIL-STD-833, Method 1001, Condition A Moisture Resistance Environment MIL-STD-833, Method 1004 Figure 3. Typical Phase Noise Plot of the NBXDBA014 Operating at 62.5 MHz Figure 4. Typical Phase Noise Plot of the NBXDBA014 Operating at 125 MHz |
Аналогичный номер детали - NBXDBA014LN1TAG |
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Аналогичное описание - NBXDBA014LN1TAG |
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