поискавой системы для электроныых деталей
  Russian  ▼
ALLDATASHEETRU.COM

X  

SN74ABT18245ADLR датащи(PDF) 4 Page - Texas Instruments

Click here to check the latest version.
номер детали SN74ABT18245ADLR
подробное описание детали  SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS
Download  34 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
производитель  TI [Texas Instruments]
домашняя страница  http://www.ti.com
Logo TI - Texas Instruments

SN74ABT18245ADLR датащи(HTML) 4 Page - Texas Instruments

  SN74ABT18245ADLR Datasheet HTML 1Page - Texas Instruments SN74ABT18245ADLR Datasheet HTML 2Page - Texas Instruments SN74ABT18245ADLR Datasheet HTML 3Page - Texas Instruments SN74ABT18245ADLR Datasheet HTML 4Page - Texas Instruments SN74ABT18245ADLR Datasheet HTML 5Page - Texas Instruments SN74ABT18245ADLR Datasheet HTML 6Page - Texas Instruments SN74ABT18245ADLR Datasheet HTML 7Page - Texas Instruments SN74ABT18245ADLR Datasheet HTML 8Page - Texas Instruments SN74ABT18245ADLR Datasheet HTML 9Page - Texas Instruments Next Button
Zoom Inzoom in Zoom Outzoom out
 4 / 34 page
background image
SN54ABT18245A, SN74ABT18245A
SCAN TEST DEVICES
WITH 18-BIT BUS TRANSCEIVERS
SCBS110H – AUGUST 1992 – REVISED FEBRUARY 1999
4
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Terminal Functions
TERMINAL
NAME
DESCRIPTION
1A1–1A9,
2A1–2A9
Normal-function A-bus I/O ports. See function table for normal-mode logic.
1B1–1B9,
2B1–2B9
Normal-function B-bus I/O ports. See function table for normal-mode logic.
1DIR, 2DIR
Normal-function direction controls. See function table for normal-mode logic.
GND
Ground
1OE, 2OE
Normal-function output enables. See function table for normal-mode logic.
TCK
Test clock. One of four terminals required by IEEE Standard 1149.1-1990. Test operations of the device are synchronous to
TCK. Data is captured on the rising edge of TCK and outputs change on the falling edge of TCK.
TDI
Test data input. One of four terminals required by IEEE Standard 1149.1-1990. TDI is the serial input for shifting data through
the instruction register or selected data register. An internal pullup forces TDI to a high level if left unconnected.
TDO
Test data output. One of four terminals required by IEEE Standard 1149.1-1990. TDO is the serial output for shifting data
through the instruction register or selected data register.
TMS
Test mode select. One of four terminals required by IEEE Standard 1149.1-1990. TMS directs the device through its TAP
controller states. An internal pullup forces TMS to a high level if left unconnected.
VCC
Supply voltage


Аналогичный номер детали - SN74ABT18245ADLR

производительномер деталидатащиподробное описание детали
logo
Texas Instruments
SN74ABT18245ADLR TI-SN74ABT18245ADLR Datasheet
436Kb / 32P
[Old version datasheet]   SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS
SN74ABT18245ADLRG4 TI-SN74ABT18245ADLRG4 Datasheet
436Kb / 32P
[Old version datasheet]   SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS
More results

Аналогичное описание - SN74ABT18245ADLR

производительномер деталидатащиподробное описание детали
logo
Texas Instruments
SN54ABT18245A TI-SN54ABT18245A Datasheet
357Kb / 28P
[Old version datasheet]   SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS
SN54ABT18245A TI-SN54ABT18245A_06 Datasheet
436Kb / 32P
[Old version datasheet]   SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS
SN54ABT18640 TI-SN54ABT18640 Datasheet
400Kb / 30P
[Old version datasheet]   SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS
SN54ABTH18502A TI-SN54ABTH18502A_08 Datasheet
832Kb / 42P
[Old version datasheet]   SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SN54ABTH18502A TI-SN54ABTH18502A Datasheet
549Kb / 37P
[Old version datasheet]   SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SN54ABTH18502A TI-SN54ABTH18502A_07 Datasheet
802Kb / 42P
[Old version datasheet]   SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
74ABTH182652APMG4 TI1-74ABTH182652APMG4 Datasheet
580Kb / 39P
[Old version datasheet]   SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS
SN54ABTH18652A TI-SN54ABTH18652A Datasheet
575Kb / 37P
[Old version datasheet]   SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS
SN54ABT18652 TI-SN54ABT18652 Datasheet
169Kb / 11P
[Old version datasheet]   SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS
SN54ABT18245 TI1-SN54ABT18245 Datasheet
435Kb / 30P
[Old version datasheet]   SCAN TEST DEVICE WITH 18-BIT BUS TRANSCEIVERS
More results


Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34


датащи скачать

Go To PDF Page


ссылки URL




Конфиденциальность
ALLDATASHEETRU.COM
Вашему бизинису помогли Аллдатащит?  [ DONATE ] 

Что такое Аллдатащит   |   реклама   |   контакт   |   Конфиденциальность   |   обмен ссыками   |   поиск по производителю
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com