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ST93C56M3013TR датащи(PDF) 2 Page - STMicroelectronics

номер детали ST93C56M3013TR
подробное описание детали  2K 128 x 16 or 256 x 8 SERIAL MICROWIRE EEPROM
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производитель  STMICROELECTRONICS [STMicroelectronics]
домашняя страница  http://www.st.com
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The memory is accessed by a set of instructions
which includes Read a byte/word, Write a
byte/word, Erase a byte/word, Erase All and Write
All. A Read instruction loads the address of the first
byte/word to be read into an internal address
pointer. The data contained at this address is then
clocked out serially. The address pointer is auto-
matically incremented after the data is output and,
if the Chip Select input (S) is held High, the
ST93C56 can output a sequential stream of data
bytes/words. In this way, the memory can be read
as a data stream from 8 to 2048 bits long, or
continuously as the address counter automatically
rolls over to ’00’ when the highest address is
reached. Programming is internally self-timed (the
external clock signal on C input may be discon-
nected or left running after the start of a Write cycle)
and does not require an erase cycle prior to the
Write instruction. The Write instruction writes 8 or
16 bits at one time into one of the 256 bytes or 128
words. After the start of the programming cycle, a
Busy/Ready signal is available on the Data output
(Q) when Chip Select (S) is driven High.
The design of the ST93C56 and the High Endur-
ance CMOS technologyused for its fabrication give
an Erase/Write cycle Endurance of 1,000,000 cy-
cles and a data retention of 40 years.
The DU (Don’t Use) pin does not affect the function
of the memory and it is reserved for use by SGS-
THOMSON during test sequences.The pin may be
left unconnected or may be connected to VCC or
VSS. Direct connection of DU to VSS is recom-
mended for the lowest standby power consump-
tion.
VSS
Q
ORG
DU
C
SVCC
D
AI00882C
ST93C56
ST93C57
1
2
3
4
8
7
6
5
Figure 2A. DIP Pin Connections
1
VSS
Q
ORG
DU
C
SVCC
D
AI00883D
ST93C56
ST93C57
2
3
4
8
7
6
5
Figure 2B. SO Pin Connections
DESCRIPTION (cont’d)
Warning: DU = Don’t Use
Warning: DU = Don’t Use
Symbol
Parameter
Value
Unit
TA
Ambient Operating Temperature
–40 to 125
°C
TSTG
Storage Temperature
–65 to 150
°C
TLEAD
Lead Temperature, Soldering
(SO8 package)
(PSDIP8 package)
40 sec
10 sec
215
260
°C
VIO
Input or Output Voltages (Q = VOH or Hi-Z)
–0.3 to VCC +0.5
V
VCC
Supply Voltage
–0.3 to 6.5
V
VESD
Electrostatic Discharge Voltage (Human Body model)
(2)
4000
V
Electrostatic Discharge Voltage (Machine model)
(3)
500
V
Notes: 1. Except for the rating ”Operating Temperature Range”, stresses above those listed in the Table ”Absolute Maximum Ratings”
may cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other
conditions above those indicated in the Operating sections of this specification is not implied. Exposure to Absolute Maximum
Rating conditions for extended periods may affect device reliability. Refer also to the SGS-THOMSON SURE Program and other
relevant quality documents.
2. MIL-STD-883C, 3015.7 (100pF, 1500
Ω).
3. EIAJ IC-121 (Condition C) (200pF, 0
Ω).
Table 2. Absolute Maximum Ratings
(1)
2/13
ST93C56/56C, ST93C57C


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