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74LVT18512DGGRE4 датащи(PDF) 3 Page - Texas Instruments

номер детали 74LVT18512DGGRE4
подробное описание детали  3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
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производитель  TI [Texas Instruments]
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74LVT18512DGGRE4 датащи(HTML) 3 Page - Texas Instruments

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SN54LVT18512, SN54LVT182512, SN74LVT18512, SN74LVT182512
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS711 – OCTOBER 1997
3
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
functional block diagram
2A1
1D
C1
1D
C1
1D
C1
1D
C1
Boundary-Control
Register
Bypass Register
Identification
Register
Boundary-Scan Register
Instruction
Register
TAP
Controller
2LEBA
2CLKBA
2OEBA
TDI
TMS
TCK
2B1
TDO
2OEAB
2LEAB
2CLKAB
1A1
1D
C1
1D
C1
1D
C1
1D
C1
1LEBA
1CLKBA
1OEBA
1B1
1OEAB
1LEAB
1CLKAB
VCC
VCC
One of Nine Channels
One of Nine Channels
2
1
3
63
64
62
4
29
30
28
36
35
37
16
34
32
33
61
49
31
VCC
VCC
VCC
VCC


Аналогичный номер детали - 74LVT18512DGGRE4

производительномер деталидатащиподробное описание детали
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Аналогичное описание - 74LVT18512DGGRE4

производительномер деталидатащиподробное описание детали
logo
Texas Instruments		 SN54LVTH18512 TI-SN54LVTH18512_07 Datasheet
703Kb / 38P		 [Old version datasheet]   3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
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