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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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74HC238N датащи(PDF) 10 Page - NXP Semiconductors |
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74HC238N датащи(HTML) 10 Page - NXP Semiconductors |
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10 / 18 page  74HC_HCT238_3 © NXP B.V. 2007. All rights reserved. Product data sheet Rev. 03 — 16 July 2007 10 of 18 NXP Semiconductors 74HC238; 74HCT238 3-to-8 line decoder/demultiplexer Test data is given in Table 9. Definitions for test circuit: RT = Termination resistance should be equal to output impedance Zo of the pulse generator. CL = Load capacitance including jig and probe capacitance. RL = Load resistance. S1 = Test selection switch Fig 8. Load circuit for measuring switching times VM VM tW tW 10 % 90 % 0 V VI VI negative pulse positive pulse 0 V VM VM 90 % 10 % tf tr tr tf 001aad983 DUT VCC VCC VI VO RT RL S1 CL open PULSE GENERATOR Table 9. Test data Type Input Load S1 position VI tr, tf CL RL tPHL, tPLH 74HC238 VCC 6 ns 15 pF, 50 pF 1 k Ω open 74HCT238 3 V 6 ns 15 pF, 50 pF 1 k Ω open |
Аналогичный номер детали - 74HC238N |
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Аналогичное описание - 74HC238N |
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