поискавой системы для электроныых деталей |
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TLP351 датащи(PDF) 4 Page - Toshiba Semiconductor |
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TLP351 датащи(HTML) 4 Page - Toshiba Semiconductor |
4 / 9 page TLP351 2010-06-17 4 Switching Characteristics (Ta = −40 to 100°C, unless otherwise specified) Characteristics Symbol Test Circuit Test Condition Min Typ.* Max Unit L → H tpLH IF = 0 → 5 mA 100 ⎯ 700 Propagation delay time H → L tpHL VCC = 30 V Rg = 47 Ω Cg = 3 nF IF = 5 → 0 mA 100 ⎯ 700 ns Propagation delay difference between any two parts or channels PDD |tpHL-tpLH| VCC = 30 V, Rg = 47 Ω, Cg = 3 nF −500 ⎯ 500 ns Output rise time (10-90%) tr IF = 0 → 5 mA ⎯ 50 ⎯ Output fall time (90-10%) tf 7 VCC = 30 V Rg = 47 Ω Cg = 3 nF IF = 5 → 0 mA ⎯ 50 ⎯ ns Common mode transient immunity at high level output CMH IF = 5 mA VO (min) = 26 V −10000 ⎯ ⎯ Common mode transient immunity at low level output CML 8 VCM = 1000 Vp-p Ta = 25°C VCC = 30 V IF = 0 mA VO (max) = 1 V 10000 ⎯ ⎯ V/ μs *: All typical values are at Ta = 25°C Test Circuit 1: IOPH Test Circuit 2: IOPL Test Circuit 3: VOH Test Circuit 4: VOL Test Circuit 5: ICCH Test Circuit 6: ICCL IF A 1 4 5 8 IOPH V8-6 VCC V 1 4 5 8 VCC IF VOH 1 4 5 8 VCC IF A ICCH A 1 4 5 8 IOPL V6-5 VCC 1 4 5 8 VOL VCC V VF 1 4 5 8 VCC A ICCL |
Аналогичный номер детали - TLP351 |
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Аналогичное описание - TLP351 |
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