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FEATURES

APPLICATIONS

DESCRIPTION

1

2

3

6

5

4

V+

REF

IN

-

OUT

V

IN+

DBVPACKAGE

(TOPVIEW)

TLV3011-EP, TLV3012-EP

SGLS349 – OCTOBER 2006

NANOPOWER 1.8-V SOT23 COMPARATORS WITH VOLTAGE REFERENCE

•

Battery-Powered Level Detection

•

Controlled Baseline

•

Data Acquisition

– One Assembly/Test Site

•

System Monitoring

– One Fabrication Site

•

Oscillators

•

Extended Temperature Performance of

•

Sensor Systems

–55

°C to 125°C

– Smoke Detectors

•

Enhanced Diminishing Manufacturing

– Light Sensors

Sources (DMS) Support

– Alarms

•

Enhanced Product-Change Notification

•

•

Low Quiescent Current = 5

µA (Max)

The

TLV3011

and

TLV3012

are

low-power,

•

Integrated Voltage Reference = 1.242 V

open-drain output comparators. The devices feature

•

Input Common-Mode Range = 200 mV

an uncommitted on-chip voltage reference, have

Beyond Rails

5-

µA (max) quiescent current, input common-mode

range

200

mV

beyond

the

supply

rails,

and

•

Voltage Reference Initial Accuracy = 1%

single-supply operation from 1.8 V to 5.5 V. The

•

Open-Drain Logic Compatible Output

integrated 1.242-V series voltage reference offers

(TLV3011)

low 100-ppm/

°C (max) drift, is stable with up to

•

Push-Pull Output (TLV3012)

10-nF capacitive load, and can provide up to

0.5 mA (typ) of output current.

•

Low Supply Voltage = 1.8 V to 5.5 V

•

Fast Response Time = 6-

µs Propagation

The TLV3011 and TLV3012 are available in the tiny

SOT23-6 package for space-conservative designs.

Delay With 100-mV Overdrive

The devices are specified for the temperature range

of –55

°C to 125°C.

•

Microsize Package: SOT23-6

(1)

Component qualification in accordance with JEDEC and

industry standards to ensure reliable operation over an

extended temperature range. This includes, but is not limited

to, Highly Accelerated Stress Test (HAST) or biased 85/85,

temperature cycle, autoclave or unbiased HAST,

electromigration, bond intermetallic life, and mold compound

life. Such qualification testing should not be viewed as

justifying use of this component beyond specified

performance and environmental limits.

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas

Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

PRODUCTION DATA information is current as of publication date.

Copyright © 2006, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.