поискавой системы для электроныых деталей |
|
TLV3011-EP датащи(PDF) 1 Page - Texas Instruments |
|
|
TLV3011-EP датащи(HTML) 1 Page - Texas Instruments |
1 / 18 page www.ti.com FEATURES APPLICATIONS DESCRIPTION 1 2 3 6 5 4 V+ REF IN - OUT V IN+ DBVPACKAGE (TOPVIEW) TLV3011-EP, TLV3012-EP SGLS349 – OCTOBER 2006 NANOPOWER 1.8-V SOT23 COMPARATORS WITH VOLTAGE REFERENCE • Battery-Powered Level Detection • Controlled Baseline • Data Acquisition – One Assembly/Test Site • System Monitoring – One Fabrication Site • Oscillators • Extended Temperature Performance of • Sensor Systems –55 °C to 125°C – Smoke Detectors • Enhanced Diminishing Manufacturing – Light Sensors Sources (DMS) Support – Alarms • Enhanced Product-Change Notification • Qualification Pedigree(1) • Low Quiescent Current = 5 µA (Max) The TLV3011 and TLV3012 are low-power, • Integrated Voltage Reference = 1.242 V open-drain output comparators. The devices feature • Input Common-Mode Range = 200 mV an uncommitted on-chip voltage reference, have Beyond Rails 5- µA (max) quiescent current, input common-mode range 200 mV beyond the supply rails, and • Voltage Reference Initial Accuracy = 1% single-supply operation from 1.8 V to 5.5 V. The • Open-Drain Logic Compatible Output integrated 1.242-V series voltage reference offers (TLV3011) low 100-ppm/ °C (max) drift, is stable with up to • Push-Pull Output (TLV3012) 10-nF capacitive load, and can provide up to 0.5 mA (typ) of output current. • Low Supply Voltage = 1.8 V to 5.5 V • Fast Response Time = 6- µs Propagation The TLV3011 and TLV3012 are available in the tiny SOT23-6 package for space-conservative designs. Delay With 100-mV Overdrive The devices are specified for the temperature range (TLV3011: RPULLUP = 10 kΩ) of –55 °C to 125°C. • Microsize Package: SOT23-6 (1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. PRODUCTION DATA information is current as of publication date. Copyright © 2006, Texas Instruments Incorporated Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. |
Аналогичный номер детали - TLV3011-EP |
|
Аналогичное описание - TLV3011-EP |
|
|
ссылки URL |
Конфиденциальность |
ALLDATASHEETRU.COM |
Вашему бизинису помогли Аллдатащит? [ DONATE ] |
Что такое Аллдатащит | реклама | контакт | Конфиденциальность | обмен ссыками | поиск по производителю All Rights Reserved©Alldatasheet.com |
Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
Family Site : ic2ic.com |
icmetro.com |