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ADM2209EARUZ датащи(PDF) 10 Page - Analog Devices |
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ADM2209EARUZ датащи(HTML) 10 Page - Analog Devices |
10 / 12 page REV. 0 ADM2209E –10– The ADM2209E is tested using both of the above-mentioned test methods. All pins are tested with respect to all other pins as per the MIL-STD-883B specification. In addition, all I-O pins are tested as per the IEC test specification. The products were tested under the following conditions: (a) Power-On—Normal Operation (b) Power-Off There are four levels of compliance defined by IEC1000-4-2. The ADM2209E meets the most stringent compliance level for both contact and air-gap discharge. This means that the products are able to withstand contact discharges in excess of 8 kV and air- gap discharges in excess of 15 kV. Table IV. IEC1000-4-2 Compliance Levels Contact Discharge Air Discharge Level kV kV 12 2 24 4 36 8 48 15 Table V. ADM2209E ESD Test Results ESD Test Method I-O Pins Other Pins MIL-STD-883B ±15 kV ±2.5 kV IEC1000-4-2 Contact ±8 kV Air ±15 kV FAST TRANSIENT BURST TESTING (IEC1000-4-4) IEC1000-4-4 (previously 801-4) covers electrical fast-transient/ burst (EFT) immunity. Electrical fast transients occur as a result of arcing contacts in switches and relays. The tests simu- late the interference generated when, for example, a power relay disconnects an inductive load. A spark is generated due to the well-known back EMF effect. In fact the spark consists of a burst of sparks as the relay contacts separate. The voltage appearing on the line, therefore, consists of a burst of extremely fast tran- sient impulses. A similar effect occurs when switching on fluo- rescent lights. The fast transient burst test defined in IEC1000-4-4 simulates this arcing and its waveform is illustrated in Figure 26. It con- sists of a burst of 2.5 kHz to 5 kHz transients repeating at 300 ms intervals. It is specified for both power and data lines. 300ms 15ms t V 5ns 0.2/0.4ms 50ns V t Figure 26. IEC1000-4-4 Fast Transient Waveform Table VI. V Peak (kV) V Peak (kV) Level PSU I-O 1 0.5 0.25 2 1 0.5 32 1 44 2 A simplified circuit diagram of the actual EFT generator is illustrated in Figure 27. RC RM CC HIGH VOLTAGE SOURCE L ZS CD 50 OUTPUT Figure 27. IEC1000-4-4 Fast Transient Generator The transients are coupled onto the signal lines using an EFT coupling clamp. The clamp is 1 meter long and it completely surrounds the cable, providing maximum coupling capacitance (50 pF to 200 pF typ) between the clamp and the cable. High energy transients are capacitively coupled onto the signal lines. Fast rise times (5 ns) as specified by the standard result in very effective coupling. This test is very severe since high voltages are coupled onto the signal lines. The repetitive transients can often cause problems where single pulses do not. Destructive latch-up may be induced due to the high energy content of the transients. Note that this stress is applied while the interface products are powered up and transmitting data. The EFT test applies hundreds of pulses with higher energy than ESD. Worst case transient current on an I-O line can be as high as 40 A. Test results are classified according to the following: 1. Normal performance within specification limits. 2. Temporary degradation or loss of performance which is self- recoverable. 3. Temporary degradation or loss of function or performance which requires operator intervention or system reset. 4. Degradation or loss of function which is not recoverable due to damage. The ADM2209E has been tested under worst case conditions using unshielded cables and meets Classification 2. Data trans- mission during the transient condition is corrupted, but it may be resumed immediately following the EFT event without user intervention. IEC1000-4-3 RADIATED IMMUNITY IEC1000-4-3 (previously IEC801-3) describes the measure- ment method and defines the levels of immunity to radiated electromagnetic fields. It was originally intended to simulate the electromagnetic fields generated by portable radio transceivers or any other device that generates continuous wave radiated electromagnetic energy. Its scope has since been broadened to include spurious EM energy which can be radiated from fluores- cent lights, thyristor drives, inductive loads, etc. |
Аналогичный номер детали - ADM2209EARUZ |
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Аналогичное описание - ADM2209EARUZ |
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