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74LVC1G157GF датащи(PDF) 8 Page - NXP Semiconductors |
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74LVC1G157GF датащи(HTML) 8 Page - NXP Semiconductors |
8 / 18 page 74LVC1G157 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved. Product data sheet Rev. 6 — 31 December 2012 8 of 18 NXP Semiconductors 74LVC1G157 Single 2-input multiplexer Test data is given in Table 10. Definitions for test circuit: RL = Load resistance. CL = Load capacitance including jig and probe capacitance. RT = Termination resistance; should be equal to the output impedance Zo of the pulse generator. VEXT = External voltage for measuring switching times. Fig 9. Test circuit for measuring switching times VEXT VCC VI VO mna616 DUT CL RT RL RL G Table 10. Test data Supply voltage Input Load VEXT VCC VI tr =tf CL RL tPLH, tPHL 1.65 V to 1.95 V VCC 2.0ns 30pF 1k open 2.3 V to 2.7 V VCC 2.0ns 30pF 500 open 2.7V 2.7V 2.5ns 50pF 500 open 3.0V to 3.6V 2.7V 2.5ns 50pF 500 open 4.5 V to 5.5 V VCC 2.5ns 50pF 500 open |
Аналогичный номер детали - 74LVC1G157GF |
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Аналогичное описание - 74LVC1G157GF |
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