поискавой системы для электроныых деталей |
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BAT54CQ-7-F датащи(PDF) 2 Page - Diodes Incorporated |
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BAT54CQ-7-F датащи(HTML) 2 Page - Diodes Incorporated |
2 / 5 page BAT54 /A /C /S Document number: DS11005 Rev. 31 - 2 2 of 5 www.diodes.com October 2013 © Diodes Incorporated BAT54 /A /C /S Marking Information Date Code Key Year 1998 … 2002 2003 … 2009 2010 2011 2012 2013 2014 2015 2016 2017 Code J … N P … W X Y Z A B C D E Month Jan Feb Mar Apr May Jun Jul Aug Sep Oct Nov Dec Code 1 2 3 4 5 6 7 8 9 O N D Maximum Ratings (@TA = +25°C, unless otherwise specified.) Characteristic Symbol Value Unit Peak Repetitive Reverse Voltage Working Peak Reverse Voltage DC Blocking Voltage VRRM VRWM VR 30 V Forward Continuous Current (Note 5) IF 200 mA Repetitive Peak Forward Current IFRM 300 mA Forward Surge Current @ t < 1.0s IFSM 600 mA Thermal Characteristics Characteristic Symbol Value Unit Power Dissipation (Note 5) PD 200 mW Typical Thermal Resistance Junction to Ambient Air (Note 5) RθJA 500 °C/W Typical Thermal Resistance Junction to Case (Note 8) RθJC 180 °C/W Operating and Storage Temperature Range (Note 6) TJ, TSTG -65 to +150 °C Electrical Characteristics (@TA = +25°C, unless otherwise specified.) Characteristic Symbol Min Typ Max Unit Test Condition Reverse Breakdown Voltage (Note 7) V(BR)R 30 V IRS = 100µA Forward Voltage VF 240 320 400 500 800 mV IF = 0.1mA IF = 1mA IF = 10mA IF = 30mA IF = 100mA Reverse Leakage Current (Note 7) IR 2.0 µA VR = 25V Total Capacitance CT 10 pF VR = 1.0V, f = 1.0MHz Reverse Recovery Time trr 5.0 ns IF = 10mA through IR = 10mA to IR = 1.0mA, RL = 100Ω Notes: 5. Part mounted on FR-4 board with recommended pad layout, which can be found on our website at http://www.diodes.com. 6. The heat generated must be less than the thermal conductivity from Junction-to-Ambient: dPD/dTJ < 1/RθJA 7. Short duration test pulse used to minimize self-heating effect. 8. Device mounted on Polymide substrate PC board. FR4 2oz 1*MRP layout. Shanghai A/T Site Chengdu A/T Site xxx = Product Type Marking Code KL1 = BAT54 KL2 = BAT54A KL3 = BAT54C KL4 = BAT54S YM = Date Code Marking for SAT (Shanghai Assembly/ Test site) Y̅M = Date Code Marking for CAT (Chengdu Assembly/ Test site) Y or Y̅ = Year (ex: A = 2013) M = Month (ex: 9 = September) |
Аналогичный номер детали - BAT54CQ-7-F |
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Аналогичное описание - BAT54CQ-7-F |
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