поискавой системы для электроныых деталей |
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74HC_HCT2G125 датащи(PDF) 8 Page - NXP Semiconductors |
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74HC_HCT2G125 датащи(HTML) 8 Page - NXP Semiconductors |
8 / 15 page 74HC_HCT2G125 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2014. All rights reserved. Product data sheet Rev. 5 — 17 March 2014 8 of 15 NXP Semiconductors 74HC2G125; 74HCT2G125 Dual buffer/line driver; 3-state Test data is given in Table 10. Definitions test circuit: RT = Termination resistance should be equal to output impedance Zo of the pulse generator. CL = Load capacitance including jig and probe capacitance. RL = Load resistance. S1 = Test selection switch. Fig 8. Test circuit for measuring switching times Table 10. Test data Type Input Load S1 position VI tr, tf CL RL tPHL, tPLH tPZH, tPHZ tPZL, tPLZ 74HC2G125 VCC 6 ns 15 pF, 50 pF 1 k open GND VCC 74HCT2G125 3 V 6 ns 15 pF, 50 pF 1 k open GND VCC |
Аналогичный номер детали - 74HC_HCT2G125_15 |
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Аналогичное описание - 74HC_HCT2G125_15 |
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