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LM3017 датащи(PDF) 3 Page - Texas Instruments |
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LM3017 датащи(HTML) 3 Page - Texas Instruments |
3 / 33 page LM3017 www.ti.com SNOSC66C – MARCH 2012 – REVISED MARCH 2013 ABSOLUTE MAXIMUM RATINGS (1) (2) over operating free-air temperature range (unless otherwise noted) MIN MAX UNIT VIN to PGND, AGND –0.3 20 V FB, COMP, VCC,DR to PGND, AGND –0.2 6 V EN/MODE -0.2 5.5 V VG -0.3 VIN+6 V ISEN to PGND, AGND VIN-0.3 VIN V Peak low side driver output current 1.0 A Power Dissipation Internally Limited Storage Temperature Range –65 150 °C Junction Temperature 150 °C ESD Susceptibility, Human Body Model(3) 1.5 kV (1) Absolute Maximum Ratings are limits beyond which damage to the device may occur. Operating Ratings indicates conditions for which the device is intended to be functional, but does not guarantee specific performance limits. For guaranteed specifications and test conditions, see the Electrical Characteristics. The guaranteed specifications apply only for the test conditions. (2) If Military/Aerospace specified devices are required, contact the Texas Instruments Sales Office/Distributors for availability and specifications. (3) The human body model is a 100 pF capacitor discharged through a 1.5k Ω resistor into each pin. Test method is per JESD-22-114. OPERATING RATINGS (1) over operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT Supply Voltage, VIN 5.4 18 V TJ Junction Temperature Range –40 +125 °C (1) Absolute Maximum Ratings are limits beyond which damage to the device may occur. Operating Ratings indicates conditions for which the device is intended to be functional, but does NOT guarantee specific performance limits. For specifications and test conditions, see the Electrical Characteristics. The specifications apply only for the test conditions. ELECTRICAL CHARACTERISTICS Limits in standard type are for TJ = 25°C only; limits apply over the junction temperature (TJ) range of –40°C to +125°C. Minimum and Maximum limits are specified through test, design or statistical correlation. Typical values represent the most likely parametric norm at TJ = 25°C, and are provided for reference purposes only. Unless otherwise stated the following conditions apply: VIN = 12V. SYMBOLS PARAMETER TEST CONDITIONS MIN(1) TYP(2) MAX(1) UNIT VFB Feedback Voltage Vcomp = 1.4V 1.256 1.27 1.282 V ΔVLINE Feedback Voltage Line Regulation 5V ≤ Vin ≤ 18V 0.33 % Input Under Voltage Lock-Out Rising 4.6 4.82 4.9 V Voltage VUVLO Input Under Voltage Lock-Out Falling; below VUVLO 280 mV Hysteresis FSW Nominal Switching Frequency EN/MODE = 1.6 V 550 600 635 kHz Low side NMOS driver resistance; 3.4 top driver FET RDS(ON) VIN = 5V, IDR = 0.2 A Ω Low side NMOS driver resistance; 1 bottom driver FET VIN < 6 V VIN V VCC Driver Voltage Supply VIN ≥ 6 V 5.6 Dmax Maximum Duty Cycle 86 % Tmin(on) Minimum On Time 125 ns (1) All limits are specified at room temperature (standard type face) and at temperature extremes (bold type face). All room temperatures are 100% production tested. All limits at temperature extremes are specified via correlation using Statistical Quality Control (SQD) methods. All limits are used to calculate Average Outgoing Quaity Level (AOQL). (2) Typical numbers are at 25°C and represent the most likely parametric norm. Copyright © 2012–2013, Texas Instruments Incorporated Submit Documentation Feedback 3 Product Folder Links :LM3017 |
Аналогичный номер детали - LM3017_15 |
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Аналогичное описание - LM3017_15 |
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