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TLP104 датащи(PDF) 4 Page - Toshiba Semiconductor |
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TLP104 датащи(HTML) 4 Page - Toshiba Semiconductor |
4 / 13 page TLP104 2015-10-16 4 Switching Characteristics (Unless otherwise specified, Ta = −40 to 125°C, VCC=15V) Characteristic Symbol Test Circuit Test Condition Min Typ. Max Unit Propagation delay time (H→L) tpHL 5 IF = 10 mA, RL = 20k Ω (Note 1) CL=100pF 30 150 400 ns CL=10pF ― 90 ― Propagation delay time (L→H) tpLH CL=100pF 150 350 550 CL=10pF ― 100 ― Switching Time Dispersion between ON and OFF |tpHL −tpLH| CL=100pF ― ― 400 Propagation Delay Skew (Note 2) tpLH −tpHL -50 ― 450 Common mode transient immunity at high output level CMH 6 VCM = 1500 Vp −p, IF = 0 mA RL = 20 k Ω, Ta=25°C 15 ― ― kV/ μs Common mode transient Immunity at low output level CML VCM = 1500 Vp −p, IF = 10 mA RL = 20 k Ω, Ta=25°C −15 ― ― kV/ μs *All typical values are at Ta=25°C Note : A ceramic capacitor (0.1 μF) should be connected from pin 6 (VCC) to pin 4 (GND) to stabilize the operation of the high gain linear amplifier. Failure to provide the bypass may impair the switching property. The total lead length between capacitor and coupler should not exceed 1 cm. Note 1: f = 10kHz, duty=10%, input current tr = tf = 5ns Note 2: Propagation delay skew is defined as the propagation delay time of the largest or smallest tpLH minus the largest or smallest tpHL of multiple samples. Evaluations of these samples are conducted under identical test conditions (supply voltage, input current, temperature, etc.). TEST CIRCUIT 1: IOH TEST CIRCUIT 2: VOL TEST CIRCUIT 3: ICCL TEST CIRCUIT 4: ICCH IF A VCC 0.1 μF ICCL 0.1 μF VOL VCC V IO ↑ SHIELD IF SHIELD A VCC 0.1 μF ICCH SHIELD 0.1 μF SHIELD VF VCC IOH A VO |
Аналогичный номер детали - TLP104 |
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Аналогичное описание - TLP104 |
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