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TLP220G датащи(PDF) 2 Page - Toshiba Semiconductor

номер детали TLP220G
подробное описание детали  Normally open (1-Form-A)
Download  8 Pages
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производитель  TOSHIBA [Toshiba Semiconductor]
домашняя страница  http://www.semicon.toshiba.co.jp/eng
Logo TOSHIBA - Toshiba Semiconductor

TLP220G датащи(HTML) 2 Page - Toshiba Semiconductor

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TLP220G
2
5.
5.
5.
5. Internal Circuit
Internal Circuit
Internal Circuit
Internal Circuit
Fig.
Fig.
Fig.
Fig. 5.1
5.1
5.1
5.1 Internal Circuit
Internal Circuit
Internal Circuit
Internal Circuit
6.
6.
6.
6. Mechanical Parameters
Mechanical Parameters
Mechanical Parameters
Mechanical Parameters
Characteristics
Creepage distances
Clearance distances
Internal isolation thickness
7.62-mm Pitch
TLP220G
7.0 (min)
7.0 (min)
0.4 (min)
10.16-mm Pitch
TLP220GF
8.0 (min)
8.0 (min)
0.4 (min)
Unit
mm
7.
7.
7.
7. Absolute Maximum Ratings (Note) (Unless otherwise specified, T
Absolute Maximum Ratings (Note) (Unless otherwise specified, T
Absolute Maximum Ratings (Note) (Unless otherwise specified, T
Absolute Maximum Ratings (Note) (Unless otherwise specified, Taaaa = 25
= 25
= 25
= 25
))))
LED
Detector
Common
Characteristics
Input forward current
Input forward current derating
Input forward current (pulsed)
Input reverse voltage
Input power dissipation
Junction temperature
OFF-state output terminal voltage
ON-state current
ON-state current derating
ON-state current (pulsed)
Output power dissipation
Junction temperature
Storage temperature
Operating temperature
Lead soldering temperature
Isolation voltage
(Ta ≥ 25)
(100 µs pulse, 100 pps)
(Ta ≥ 25)
(t = 100 ms, Duty = 1/10)
(10 s)
AC, 1 min, R.H. ≤ 60%
Symbol
IF
∆IF/∆Ta
IFP
VR
PD
Tj
VOFF
ION
∆ION/∆Ta
IONP
PO
Tj
Tstg
Topr
Tsol
BVS
Note
(Note 1)
Rating
30
-0.3
1
5
50
125
350
100
-1.0
300
500
125
-55 to 125
-40 to 85
260
5000
Unit
mA
mA/
A
V
mW
V
mA
mA/
mA
mW
Vrms
Note:
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note 1: This device is considered as a two-terminal device: Pins 1 and 2 are shorted together, and pins 3 and 4 are
shorted together.
2013-02-04
Rev.4.0


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